{"id":825,"date":"2024-07-13T03:17:14","date_gmt":"2024-07-13T03:17:14","guid":{"rendered":"https:\/\/drjuliovazqueztechdesign.com\/?page_id=825"},"modified":"2024-09-19T18:18:50","modified_gmt":"2024-09-19T18:18:50","slug":"inicio","status":"publish","type":"page","link":"https:\/\/drjuliovazqueztechdesign.com\/en\/","title":{"rendered":"Home"},"content":{"rendered":"<div class=\"wp-block-stackable-columns stk-block-columns stk-block stk-36d16f8\" data-block-id=\"36d16f8\"><style>.stk-36d16f8{margin-bottom:50px !important}<\/style><div class=\"stk-row stk-inner-blocks stk-block-content stk-content-align stk-36d16f8-column\">\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-35bfb77\" data-v=\"4\" data-block-id=\"35bfb77\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-35bfb77-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-35bfb77-inner-blocks\">\n<div class=\"wp-block-stackable-image stk-block-image stk-block stk-9ee16b4\" data-block-id=\"9ee16b4\"><figure><span class=\"stk-img-wrapper stk-image--shape-stretch\"><img loading=\"lazy\" decoding=\"async\" class=\"stk-img wp-image-1223\" src=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Black-and-Purple-Modern-Financial-Consultant-LinkedIn-Background-Photo.gif\" width=\"1584\" height=\"396\"\/><\/span><\/figure><\/div>\n<\/div><\/div><\/div>\n<\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-columns alignfull stk-block-columns stk-has-top-separator stk-has-bottom-separator stk-block stk-46a5810 stk-block-background\" data-block-id=\"46a5810\"><style>.stk-46a5810{min-height:900px !important;align-items:center !important;margin-bottom:0px !important;display:flex !important}<\/style><div class=\"stk-separator stk-separator__top\"><div class=\"stk-separator__wrapper\"><svg xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 1600 200\" class=\"stk-separator__layer-1\" preserveaspectratio=\"none\" aria-hidden=\"true\"><path class=\"curve-1_svg__st2\" d=\"M1610 177.3C1423 122.9 1133.3 88 808 88c-334.7 0-631.8 37-818 94.1v28h1620v-32.8z\"><\/path><\/svg><\/div><\/div><div class=\"stk-row stk-inner-blocks stk-block-content stk-content-align stk-46a5810-column\">\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-949e3c7\" data-v=\"4\" data-block-id=\"949e3c7\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-949e3c7-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-949e3c7-inner-blocks\">\n<div class=\"wp-block-stackable-columns stk-block-columns stk-block stk-9958e60\" data-block-id=\"9958e60\"><style>.stk-9958e60-column{--stk-column-gap:48px !important}<\/style><div class=\"stk-row stk-inner-blocks stk-block-content stk-content-align stk-9958e60-column\">\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-b9ce9af\" data-v=\"4\" data-block-id=\"b9ce9af\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-b9ce9af-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-b9ce9af-inner-blocks\">\n<div class=\"wp-block-stackable-image stk-block-image has-text-align-center stk-block stk-c4a05f8\" data-block-id=\"c4a05f8\"><style>.stk-c4a05f8{min-height:0px !important;align-items:flex-end !important;max-width:852px !important;margin-right:0px !important;margin-left:auto !important;display:flex !important}.stk-c4a05f8 .stk-img-wrapper{width:80% !important}<\/style><figure><span class=\"stk-img-wrapper stk-image--shape-stretch\"><img loading=\"lazy\" decoding=\"async\" class=\"stk-img wp-image-1457\" src=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/08\/yo_nueva1_compresed.png\" width=\"1092\" height=\"1544\" srcset=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/08\/yo_nueva1_compresed.png 1092w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/08\/yo_nueva1_compresed-212x300.png 212w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/08\/yo_nueva1_compresed-724x1024.png 724w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/08\/yo_nueva1_compresed-768x1086.png 768w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/08\/yo_nueva1_compresed-1086x1536.png 1086w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/08\/yo_nueva1_compresed-8x12.png 8w\" sizes=\"auto, (max-width: 1092px) 100vw, 1092px\" \/><\/span><\/figure><\/div>\n<\/div><\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-2409e5a\" data-v=\"4\" data-block-id=\"2409e5a\"><style>.stk-2409e5a-inner-blocks{justify-content:center !important}.stk-2409e5a-container{display:flex !important}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-2409e5a-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-2409e5a-inner-blocks\">\n<div class=\"wp-block-stackable-heading aligncenter stk-block-heading stk-block-heading--v2 stk-block stk-e47fe24\" id=\"dr-julio-cesar-vazquez\" data-block-id=\"e47fe24\"><h1 class=\"stk-block-heading__text has-text-align-center\">Julio C\u00e9sar V\u00e1zquez, Ph.D.<\/h1><\/div>\n\n\n\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-1ee2c4b\" data-block-id=\"1ee2c4b\"><style>.stk-1ee2c4b{margin-bottom:0px !important}<\/style><p class=\"stk-block-text__text has-text-align-justify\">Julio C\u00e9sar V\u00e1zquez is a highly skilled and experienced engineer, with a strong focus on technological innovation and problem-solving. His expertise lies in the design of electronic systems hardware, with a particular emphasis on Digital Integrated Circuit (IC) design.<br>Dr. V\u00e1zquez earned his Ph.D. and Master's degrees in Science from the National Institute of Astrophysics, Optics, and Electronics (INAOE). His specialization is in VLSI (Very Large Scale Integration) Integrated Circuit Design. His doctoral thesis received significant recognition, being awarded by an international committee of experts in IC design and testing as the best doctoral thesis at the Latin-American Test Workshop held in Fortaleza, Brazil, in 2014.<br>He has authored multiple scientific articles published in international journals and conferences.<br>Throughout his master's and doctoral studies, as well as his involvement in the industry, he has gained extensive experience in the following areas<\/p><\/div>\n\n\n\n<ul class=\"wp-block-list\">\n<li style=\"font-size:clamp(14px, 0.875rem + ((1vw - 3.2px) * 0.234), 17px);\"><strong><em>VLSI Design and Test<\/em><\/strong> He employed the pre-silicon VLSI design flow to design digital structures, validate them both functionally and temporally, and apply the performance optimization proposals developed in his doctoral thesis.<\/li>\n\n\n\n<li style=\"font-size:clamp(14px, 0.875rem + ((1vw - 3.2px) * 0.234), 17px);\"><strong><em>Electronic System Design:<\/em> <\/strong>He has designed analog, digital, and mixed electronic systems.<\/li>\n\n\n\n<li style=\"font-size:clamp(14px, 0.875rem + ((1vw - 3.2px) * 0.234), 17px);\"><strong><em>Embedded Systems:<\/em><\/strong> He has developed embedded firmware for microcontroller-based designs<\/li>\n\n\n\n<li style=\"font-size:clamp(14px, 0.875rem + ((1vw - 3.2px) * 0.234), 17px);\"><strong><em>Internet of Things (IoT)<\/em><\/strong> He has developed solutions that integrate and communicate various IoT technology devices<\/li>\n<\/ul>\n\n\n\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-f71ab23\" data-block-id=\"f71ab23\"><p class=\"stk-block-text__text has-text-align-justify\">His contributions to scientific research and industrial practical applications demonstrate his capability to drive technological advancements and solve complex engineering problems.<\/p><\/div>\n<\/div><\/div><\/div>\n<\/div><\/div>\n<\/div><\/div><\/div>\n<\/div><div class=\"stk-separator stk-separator__bottom\"><div class=\"stk-separator__wrapper\"><svg xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 1600 200\" class=\"stk-separator__layer-1\" preserveaspectratio=\"none\" aria-hidden=\"true\"><path class=\"curve-1_svg__st2\" d=\"M1610 177.3C1423 122.9 1133.3 88 808 88c-334.7 0-631.8 37-818 94.1v28h1620v-32.8z\"><\/path><\/svg><\/div><\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-columns alignwide stk-block-columns stk-has-top-separator stk-has-bottom-separator stk-block stk-88ea420 stk-block-background\" data-block-id=\"88ea420\"><style>.stk-88ea420{background-color:var(--theme-palette-color-5,#e1e8ed) !important;margin-bottom:0px !important}.stk-88ea420:before{background-color:var(--theme-palette-color-5,#e1e8ed) !important}<\/style><div class=\"stk-separator stk-separator__top\"><div class=\"stk-separator__wrapper\"><svg xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 1600 200\" class=\"stk-separator__layer-1\" preserveaspectratio=\"none\" aria-hidden=\"true\"><path class=\"wave-1_svg__st2\" d=\"M1341.4 48.9c-182.4 0-254.2 80.4-429.4 80.4-117.8 0-209.7-67.5-393.5-67.5-142.2 0-212.6 38.8-324.6 38.8S-10 64.7-10 64.7V210h1620V102c-110.6-40.2-181-53.1-268.6-53.1z\"><\/path><\/svg><\/div><\/div><div class=\"stk-row stk-inner-blocks stk-block-content stk-content-align stk-88ea420-column\">\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-a05b8d0\" data-v=\"4\" data-block-id=\"a05b8d0\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-a05b8d0-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-a05b8d0-inner-blocks\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-d62c308\" id=\"habilidades-relevantes\" data-block-id=\"d62c308\"><h2 class=\"stk-block-heading__text has-text-align-center\">Relevant Skills<\/h2><\/div>\n\n\n\n<div class=\"wp-block-stackable-columns stk-block-columns stk-block stk-8193d5d\" data-block-id=\"8193d5d\"><div class=\"stk-row stk-inner-blocks stk-block-content stk-content-align stk-8193d5d-column\">\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-890b6c5\" data-v=\"4\" data-block-id=\"890b6c5\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-890b6c5-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-890b6c5-inner-blocks\">\n<div class=\"wp-block-stackable-card stk-block-card stk-block stk-44756df is-style-default\" data-v=\"2\" data-block-id=\"44756df\"><div class=\"stk--no-padding stk-container stk-44756df-container stk-hover-parent\"><figure class=\"stk-block-card__image stk-img-wrapper stk-image--shape-stretch\"><img loading=\"lazy\" decoding=\"async\" class=\"stk-img wp-image-1530\" src=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/09\/oblea-de-silicio2.jpg\" width=\"600\" height=\"347\" srcset=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/09\/oblea-de-silicio2.jpg 600w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/09\/oblea-de-silicio2-300x174.jpg 300w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/09\/oblea-de-silicio2-18x10.jpg 18w\" sizes=\"auto, (max-width: 600px) 100vw, 600px\" \/><\/figure><div class=\"stk-container-padding stk-block-card__content\"><div class=\"stk-block-content stk-inner-blocks stk-44756df-inner-blocks\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-6a32e45\" id=\"diseno-y-verificacion-vlsi\" data-block-id=\"6a32e45\"><style>.stk-6a32e45{margin-bottom:16px !important}<\/style><h3 class=\"stk-block-heading__text has-text-align-center\">VLSI Desing and Verification<\/h3><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon-list stk-block-icon-list stk-block stk-4c24691\" data-block-id=\"4c24691\"><svg style=\"display:none\"><defs><g id=\"stk-icon-list__icon-svg-def-4c24691\"><svg xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 190 190\"><polygon points=\"173.8,28.4 60.4,141.8 15.7,97.2 5.1,107.8 60.4,163 184.4,39 173.8,28.4\"\/><\/svg><\/g><\/defs><\/svg><ul class=\"stk-block-icon-list__ul stk-block-icon-list--column\">\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-f9a3023\" data-block-id=\"f9a3023\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-4c24691\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Extensive knowledge of Integrated Circuit (IC) manufacturing technologies.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-327c368\" data-block-id=\"327c368\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-4c24691\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Knowledge of the design flow for Application-Specific Integrated Circuits (ASICs). <\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-96577c8\" data-block-id=\"96577c8\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-4c24691\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Knowledge of relevant VLSI frontend and VLSI backend engineering processes.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-1d5fe29\" data-block-id=\"1d5fe29\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-4c24691\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Register Transfer Level (RTL) design.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-d275df8\" data-block-id=\"d275df8\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-4c24691\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Proficiency in Hardware Description Languages: VHDL, Verilog, and SystemVerilog. <\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-ee9b8a0\" data-block-id=\"ee9b8a0\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-4c24691\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Proficiency in CAD tools: HSPICE, Modelsim, Mentor Graphics, Cadence, Altium.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-fa36806\" data-block-id=\"fa36806\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-4c24691\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Functional and timing verification in VLSI digital systems.\"<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-08e8b98\" data-block-id=\"08e8b98\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-4c24691\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Implementation of the Universal Verification Methodology (UVM) with SystemVerilog.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-1b3afd4\" data-block-id=\"1b3afd4\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-4c24691\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Use of Static Timing Analysis (STA) tools for timing analysis in VLSI Digital Systems.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-74fdbba\" data-block-id=\"74fdbba\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-4c24691\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Knowledge of Design for Testability (DFT) within the chip.<\/span><\/div><\/li>\n<\/ul><\/div>\n<\/div><\/div><\/div><\/div>\n<\/div><\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-add79b3\" data-v=\"4\" data-block-id=\"add79b3\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-add79b3-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-add79b3-inner-blocks\">\n<div class=\"wp-block-stackable-card stk-block-card stk-block stk-e0f2baa is-style-default\" data-v=\"2\" data-block-id=\"e0f2baa\"><div class=\"stk--no-padding stk-container stk-e0f2baa-container stk-hover-parent\"><figure class=\"stk-block-card__image stk-img-wrapper stk-image--shape-stretch\"><img loading=\"lazy\" decoding=\"async\" class=\"stk-img wp-image-806\" src=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/electronics-7701552_1280.jpg\" width=\"1280\" height=\"770\" srcset=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/electronics-7701552_1280.jpg 1280w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/electronics-7701552_1280-300x180.jpg 300w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/electronics-7701552_1280-1024x616.jpg 1024w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/electronics-7701552_1280-768x462.jpg 768w\" sizes=\"auto, (max-width: 1280px) 100vw, 1280px\" \/><\/figure><div class=\"stk-container-padding stk-block-card__content\"><div class=\"stk-block-content stk-inner-blocks stk-e0f2baa-inner-blocks\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-5040e76\" id=\"diseno-de-hardware\" data-block-id=\"5040e76\"><style>.stk-5040e76{margin-bottom:16px !important}<\/style><h3 class=\"stk-block-heading__text has-text-align-center\">Hardware Design<\/h3><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon-list stk-block-icon-list stk-block stk-75f3317\" data-block-id=\"75f3317\"><svg style=\"display:none\"><defs><g id=\"stk-icon-list__icon-svg-def-75f3317\"><svg xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 190 190\"><polygon points=\"173.8,28.4 60.4,141.8 15.7,97.2 5.1,107.8 60.4,163 184.4,39 173.8,28.4\"\/><\/svg><\/g><\/defs><\/svg><ul class=\"stk-block-icon-list__ul stk-block-icon-list--column\">\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-c7f76e0\" data-block-id=\"c7f76e0\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-75f3317\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Commercial Off-The-Shelf (COTS) Analog and Digital Electronics System Design.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-55443e6\" data-block-id=\"55443e6\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-75f3317\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Design of Electronic Systems on Printed Circuit Boards (PCBs).<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-f015596\" data-block-id=\"f015596\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-75f3317\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Proficiency with CAD tools:<br>        * Matlab<br>        * Simulink  <\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-e866912\" data-block-id=\"e866912\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-75f3317\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Proficiency in programming languages: <br>        * C<br>        * C++ <br>        * Python.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-ff38789\" data-block-id=\"ff38789\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-75f3317\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Manejo de diversos protocolos de comunicaci\u00f3n digital a nivel dispositivo: USART, SPI, I2C, CANBUS, LIN, Ethernet.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-f7c3f95\" data-block-id=\"f7c3f95\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-75f3317\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Use of wireless communication modules, such as: Bluetooth, LoraWAN y WiFi.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-98cfc44\" data-block-id=\"98cfc44\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-75f3317\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Development and implementation of hardware for Internet of Things (IoT) systems.<\/span><\/div><\/li>\n<\/ul><\/div>\n<\/div><\/div><\/div><\/div>\n<\/div><\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-d8bb08c\" data-v=\"4\" data-block-id=\"d8bb08c\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-d8bb08c-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-d8bb08c-inner-blocks\">\n<div class=\"wp-block-stackable-card stk-block-card stk-block stk-3fea5b3 is-style-default\" data-v=\"2\" data-block-id=\"3fea5b3\"><div class=\"stk--no-padding stk-container stk-3fea5b3-container stk-hover-parent\"><figure class=\"stk-block-card__image stk-img-wrapper stk-image--shape-stretch\"><img loading=\"lazy\" decoding=\"async\" class=\"stk-img wp-image-977\" src=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Firmware.jpg\" width=\"948\" height=\"1422\" srcset=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Firmware.jpg 948w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Firmware-200x300.jpg 200w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Firmware-683x1024.jpg 683w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Firmware-768x1152.jpg 768w\" sizes=\"auto, (max-width: 948px) 100vw, 948px\" \/><\/figure><div class=\"stk-container-padding stk-block-card__content\"><div class=\"stk-block-content stk-inner-blocks stk-3fea5b3-inner-blocks\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-41cb0d7\" id=\"diseno-de-firmware\" data-block-id=\"41cb0d7\"><style>.stk-41cb0d7{margin-bottom:16px !important}<\/style><h3 class=\"stk-block-heading__text has-text-align-center\">Firmware Design<\/h3><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon-list stk-block-icon-list stk-block stk-350d288\" data-block-id=\"350d288\"><svg style=\"display:none\"><defs><g id=\"stk-icon-list__icon-svg-def-350d288\"><svg xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 190 190\"><polygon points=\"173.8,28.4 60.4,141.8 15.7,97.2 5.1,107.8 60.4,163 184.4,39 173.8,28.4\"\/><\/svg><\/g><\/defs><\/svg><ul class=\"stk-block-icon-list__ul stk-block-icon-list--column\">\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-eaaa5dc\" data-block-id=\"eaaa5dc\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-350d288\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Embedded Firmware Development for diferent Microcontrollers such as: ST, Renesas, NXP, Atmel y PIC.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-4943c57\" data-block-id=\"4943c57\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-350d288\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Aplication Programming Interfaces (APIs) design for structured embedded firmware development.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-1085212\" data-block-id=\"1085212\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-350d288\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Hardware Abstraction Level (HAL) for ST and Renesas Microcontrollers.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-74088c6\" data-block-id=\"74088c6\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-350d288\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Experience with next IDEs: STM32CubeIDE, e2Studio y Kinetis Design Studio.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-f86c7f1\" data-block-id=\"f86c7f1\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-350d288\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Knowledge of Real-Time Operating Systems, specifically FreeRTOS.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-caeb368\" data-block-id=\"caeb368\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-350d288\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Implementation of custom-designed bootloaders for microcontrollers embedded firmware updates<\/span><\/div><\/li>\n<\/ul><\/div>\n<\/div><\/div><\/div><\/div>\n<\/div><\/div><\/div>\n<\/div><\/div>\n<\/div><\/div><\/div>\n<\/div><div class=\"stk-separator stk-separator__bottom\"><div class=\"stk-separator__wrapper\"><svg xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 1600 200\" class=\"stk-separator__layer-1\" preserveaspectratio=\"none\" aria-hidden=\"true\"><path class=\"wave-1_svg__st2\" d=\"M1341.4 48.9c-182.4 0-254.2 80.4-429.4 80.4-117.8 0-209.7-67.5-393.5-67.5-142.2 0-212.6 38.8-324.6 38.8S-10 64.7-10 64.7V210h1620V102c-110.6-40.2-181-53.1-268.6-53.1z\"><\/path><\/svg><\/div><\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-columns alignwide stk-block-columns stk-has-top-separator stk-has-bottom-separator stk-block stk-5a350aa stk-block-background\" data-block-id=\"5a350aa\"><style>.stk-5a350aa{background-color:var(--theme-palette-color-5,#e1e8ed) !important;margin-bottom:0px !important}.stk-5a350aa:before{background-color:var(--theme-palette-color-5,#e1e8ed) !important}<\/style><div class=\"stk-separator stk-separator__top\"><div class=\"stk-separator__wrapper\"><svg xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 1600 200\" class=\"stk-separator__layer-1\" preserveaspectratio=\"none\" aria-hidden=\"true\"><path class=\"wave-1_svg__st2\" d=\"M1341.4 48.9c-182.4 0-254.2 80.4-429.4 80.4-117.8 0-209.7-67.5-393.5-67.5-142.2 0-212.6 38.8-324.6 38.8S-10 64.7-10 64.7V210h1620V102c-110.6-40.2-181-53.1-268.6-53.1z\"><\/path><\/svg><\/div><\/div><div class=\"stk-row stk-inner-blocks stk-block-content stk-content-align stk-5a350aa-column\">\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-f581bc7\" data-v=\"4\" data-block-id=\"f581bc7\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-f581bc7-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-f581bc7-inner-blocks\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-a2f8ba3\" id=\"cursos-realizados\" data-block-id=\"a2f8ba3\"><h2 class=\"stk-block-heading__text has-text-align-center\">Courses Undertaken<\/h2><\/div>\n\n\n\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-2b0acfe\" data-block-id=\"2b0acfe\"><p class=\"stk-block-text__text\">As part of the ongoing professional development essential for an engineer specializing in technological innovation, several courses have been undertaken to enhance and update key competencies. Below is a list of the most relevant courses, completed through virtual platforms, which have significantly contributed to the strengthening of the professional profile.<\/p><\/div>\n\n\n\n<div class=\"wp-block-stackable-columns stk-block-columns stk-block stk-e1a3fd7\" data-block-id=\"e1a3fd7\"><div class=\"stk-row stk-inner-blocks stk-block-content stk-content-align stk-e1a3fd7-column\">\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-a9dac6f\" data-v=\"4\" data-block-id=\"a9dac6f\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-a9dac6f-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-a9dac6f-inner-blocks\">\n<ul class=\"wp-block-list\">\n<li><strong>Electronic Circuit Design:<\/strong>\n<ul class=\"wp-block-list\">\n<li><a href=\"https:\/\/www.udemy.com\/course\/introduction-to-vhdl-for-fpga-and-asic-design\/\" target=\"_blank\" rel=\"noopener\" title=\"\">Introduction to VHDL for FPGA and ASIC design<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/introduccion-a-sistemas-digitales-con-verilog\/\" target=\"_blank\" rel=\"noopener\" title=\"\">Verilog para FPGAs<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/analog_ic_design_overview\/\" target=\"_blank\" rel=\"noopener\" title=\"\">CMOS Analog Circuit Design<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/esd-an-analog-design-viewpoint\/\" target=\"_blank\" rel=\"noopener\" title=\"\"><\/a><a href=\"https:\/\/www.udemy.com\/course\/uvm-for-verification-part-1-fundamentals\/\" target=\"_blank\" rel=\"noopener\" title=\"\">UVM for Verification Part 1 : Fundamentals<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/complete-systemverilog-for-rtl-verification-part-1\/\" target=\"_blank\" rel=\"noopener\" title=\"\">SystemVerilog for Verification Part 1: Fundamentals<\/a><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>Embedded Systems:<\/strong>\n<ul class=\"wp-block-list\">\n<li><a href=\"https:\/\/www.udemy.com\/course\/mastering-rtos-hands-on-with-freertos-arduino-and-stm32fx\/\" target=\"_blank\" rel=\"noopener\" title=\"\">Mastering RTOS: Hands on FreeRTOS and STM32Fx with Debugging<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/embedded-system-design-using-uml-state-machines\/\" target=\"_blank\" rel=\"noopener\" title=\"\">Embedded System Design using UML State Machines<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/ethernet-on-stm32-using-w5500\/\" target=\"_blank\" rel=\"noopener\" title=\"\">Embedded Ethernet on STM32 Using W5500 for IoT Applications<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/usb-behind-the-scenes-hands-on-hid-firmware-development\/\" target=\"_blank\" rel=\"noopener\" title=\"\">USB Behind the Scenes: Hands-on HID Firmware Development<\/a><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>Internet of Things (IoT)<\/strong>\n<ul class=\"wp-block-list\">\n<li><a href=\"https:\/\/www.udemy.com\/course\/stm32-internet-of-things-with-4g-lte-modem-hardware\/\" target=\"_blank\" rel=\"noopener\" title=\"\">STM32 : Internet Of Things with 4G LTE Modem &#8211; Hardware<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/iot-application-development-with-the-esp32-using-the-esp-idf\/\" target=\"_blank\" rel=\"noopener\" title=\"\">IoT Application Development with the ESP32 Using the ESP-IDF<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/exploring-aws-iot\/\" target=\"_blank\" rel=\"noopener\" title=\"\">Exploring AWS IoT<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/lorawan-academy\/\" target=\"_blank\" rel=\"noopener\" title=\"\">The Things Academy: Hands on with LoRaWAN\u00ae<\/a><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>Artificial Intelligence and Machine Learning:<\/strong>\n<ul class=\"wp-block-list\">\n<li><a href=\"https:\/\/www.udemy.com\/course\/mlmasterclass\/\" target=\"_blank\" rel=\"noopener\" title=\"\">Machine Learning 2022 Redes Neuronales con Python desde Cero<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/cuda-programming-masterclass\/\" target=\"_blank\" rel=\"noopener\" title=\"\">CUDA programming Masterclass with C++<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/aceleracao-de-aplicacoes-de-ia-com-nvidia-rapids\/\" target=\"_blank\" rel=\"noopener\" title=\"\">Acelera\u00e7\u00e3o de Aplica\u00e7\u00f5es de IA com NVIDIA RAPIDS<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/computer-vision-y-machine-learning-con-python\/\" target=\"_blank\" rel=\"noopener\" title=\"\">Computer Vision y Machine Learning con Python<\/a><\/li>\n<\/ul>\n<\/li>\n\n\n\n<li><strong>Automotive:<\/strong>\n<ul class=\"wp-block-list\">\n<li><a href=\"https:\/\/www.udemy.com\/course\/applied-deep-learningtm-the-complete-self-driving-car-course\/\" target=\"_blank\" rel=\"noopener\" title=\"\">The Complete Self-Driving Car Course &#8211; Applied Deep Learning<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/applied-systems-control-for-engineers-modelling-pid-mpc\/\" target=\"_blank\" rel=\"noopener\" title=\"\">Applied Control Systems 1: autonomous cars: Math + PID + MPC<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/data-fusion-with-linear-kalman-filter\/\" target=\"_blank\" rel=\"noopener\" title=\"\">Data Fusion with Linear Kalman Filter<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/automotive-ethernet\/\" target=\"_blank\" rel=\"noopener\" title=\"\">Automotive Ethernet<\/a><\/li>\n\n\n\n<li><a href=\"https:\/\/www.udemy.com\/course\/automotive-over-the-air-update-ota\/\" target=\"_blank\" rel=\"noopener\" title=\"\">Automotive &#8211; Over The Air Update [ OTA ]<\/a><\/li>\n<\/ul>\n<\/li>\n<\/ul>\n<\/div><\/div><\/div>\n<\/div><\/div>\n<\/div><\/div><\/div>\n<\/div><div class=\"stk-separator stk-separator__bottom\"><div class=\"stk-separator__wrapper\"><svg xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 1600 200\" class=\"stk-separator__layer-1\" preserveaspectratio=\"none\" aria-hidden=\"true\"><path class=\"wave-1_svg__st2\" d=\"M1341.4 48.9c-182.4 0-254.2 80.4-429.4 80.4-117.8 0-209.7-67.5-393.5-67.5-142.2 0-212.6 38.8-324.6 38.8S-10 64.7-10 64.7V210h1620V102c-110.6-40.2-181-53.1-268.6-53.1z\"><\/path><\/svg><\/div><\/div><\/div>\n\n\n\n<details class=\"wp-block-stackable-accordion stk-block-accordion stk-inner-blocks stk-block-content stk-block stk-afe4e83 is-style-default\" data-block-id=\"afe4e83\">\n<summary class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-f91b5e2 stk--container-small stk-block-accordion__heading\" data-v=\"4\" data-block-id=\"f91b5e2\"><style>.stk-f91b5e2-container{box-shadow:none !important}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-f91b5e2-container stk-hover-parent\"><div class=\"stk-block-content stk-inner-blocks stk-f91b5e2-inner-blocks\">\n<div class=\"wp-block-stackable-icon-label stk-block-icon-label stk-block stk-9fdc901\" data-block-id=\"9fdc901\"><div class=\"stk-row stk-inner-blocks stk-block-content\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-dd3d5f9\" id=\"experiencia-laboral\" data-block-id=\"dd3d5f9\"><h2 class=\"stk-block-heading__text\">Work Experience<\/h2><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon stk-block-icon stk-block stk-6043957\" data-block-id=\"6043957\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg style=\"height:0;width:0\"><defs><lineargradient id=\"linear-gradient-6043957\" x1=\"0\" x2=\"100%\" y1=\"0\" y2=\"0\"><stop offset=\"0%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-6043957-color-1)\"><\/stop><stop offset=\"100%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-6043957-color-2)\"><\/stop><\/lineargradient><\/defs><\/svg><svg data-prefix=\"fas\" data-icon=\"chevron-down\" class=\"svg-inline--fa fa-chevron-down fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 448 512\" aria-hidden=\"true\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M207.029 381.476L12.686 187.132c-9.373-9.373-9.373-24.569 0-33.941l22.667-22.667c9.357-9.357 24.522-9.375 33.901-.04L224 284.505l154.745-154.021c9.379-9.335 24.544-9.317 33.901.04l22.667 22.667c9.373 9.373 9.373 24.569 0 33.941L240.971 381.476c-9.373 9.372-24.569 9.372-33.942 0z\"><\/path><\/svg><\/div><\/span><\/div>\n<\/div><\/div>\n<\/div><\/div><\/summary>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-62a79ed stk-block-accordion__content\" data-v=\"4\" data-block-id=\"62a79ed\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-62a79ed-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-62a79ed-inner-blocks\">\n<div class=\"wp-block-stackable-columns stk-block-columns stk-block stk-94baae9\" data-block-id=\"94baae9\"><div class=\"stk-row stk-inner-blocks stk-block-content stk-content-align stk-94baae9-column\">\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-5e9e578\" data-v=\"4\" data-block-id=\"5e9e578\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-5e9e578-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-5e9e578-inner-blocks\">\n<div class=\"wp-block-stackable-icon-box stk-block-icon-box stk-block stk-151616c\" data-v=\"2\" data-block-id=\"151616c\"><style>.stk-151616c{margin-bottom:50px !important}<\/style><div class=\"stk-block-content stk-inner-blocks stk-block-icon-box__content stk-container stk-151616c-container stk--no-background stk--no-padding\">\n<div class=\"wp-block-stackable-icon-label stk-block-icon-label stk-block stk-fc81e19\" data-block-id=\"fc81e19\"><style>.stk-fc81e19{margin-bottom:0px !important}<\/style><div class=\"stk-row stk-inner-blocks stk-block-content\">\n<div class=\"wp-block-stackable-icon stk-block-icon has-text-align-left stk-block stk-4a54ace\" data-block-id=\"4a54ace\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg style=\"height:0;width:0\"><defs><lineargradient id=\"linear-gradient-4a54ace\" x1=\"0\" x2=\"100%\" y1=\"0\" y2=\"0\"><stop offset=\"0%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-4-a-54-ace-color-1)\"><\/stop><stop offset=\"100%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-4-a-54-ace-color-2)\"><\/stop><\/lineargradient><\/defs><\/svg><svg xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 512 512\" aria-hidden=\"true\" width=\"32\" height=\"32\"><path d=\"M177.8 63.2l10 17.4c2.8 4.8 4.2 10.3 4.2 15.9v41.4c0 3.9 1.6 7.7 4.3 10.4c6.2 6.2 16.5 5.7 22-1.2l13.6-17c4.7-5.9 12.9-7.7 19.6-4.3l15.2 7.6c3.4 1.7 7.2 2.6 11 2.6c6.5 0 12.8-2.6 17.4-7.2l3.9-3.9c2.9-2.9 7.3-3.6 11-1.8l29.2 14.6c7.8 3.9 12.6 11.8 12.6 20.5c0 10.5-7.1 19.6-17.3 22.2l-35.4 8.8c-7.4 1.8-15.1 1.5-22.4-.9l-32-10.7c-3.3-1.1-6.7-1.7-10.2-1.7c-7 0-13.8 2.3-19.4 6.5L176 212c-10.1 7.6-16 19.4-16 32v28c0 26.5 21.5 48 48 48h32c8.8 0 16 7.2 16 16v48c0 17.7 14.3 32 32 32c10.1 0 19.6-4.7 25.6-12.8l25.6-34.1c8.3-11.1 12.8-24.6 12.8-38.4V318.6c0-3.9 2.6-7.3 6.4-8.2l5.3-1.3c11.9-3 20.3-13.7 20.3-26c0-7.1-2.8-13.9-7.8-18.9l-33.5-33.5c-3.7-3.7-3.7-9.7 0-13.4c5.7-5.7 14.1-7.7 21.8-5.1l14.1 4.7c12.3 4.1 25.7-1.5 31.5-13c3.5-7 11.2-10.8 18.9-9.2l27.4 5.5C432 112.4 351.5 48 256 48c-27.7 0-54 5.4-78.2 15.2zM0 256a256 256 0 1 1 512 0A256 256 0 1 1 0 256z\"><\/path><\/svg><\/div><\/span><\/div>\n\n\n\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-b0f4ef3\" id=\"innovalinks\" data-block-id=\"b0f4ef3\"><h4 class=\"stk-block-heading__text\">Innovalinks <\/h4><\/div>\n<\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-181ddc8\" data-block-id=\"181ddc8\"><p class=\"stk-block-text__text has-text-align-justify\"><strong>Job Position:<\/strong> Hardware Engineer<br><strong>Immediate Supervisor:<\/strong> M.Sc. Jose Luis Hern\u00e1ndez Chao.<br><strong>Employment Period:<\/strong> 2017-2024<br><strong>General Description:<\/strong> Design electronic systems for Internet of Things (IoT) applications in the Transportation and Logistics industry. The designs are based in the integration of existing semiconductor devices on the market that meet the initial design requirements.<\/p><\/div>\n\n\n\n<details class=\"wp-block-stackable-accordion stk-block-accordion stk-inner-blocks stk-block-content stk-block stk-43987da is-style-default\" data-block-id=\"43987da\"><style>.stk-43987da{margin-bottom:0px !important}<\/style>\n<summary class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-0dec7f3 stk--container-small stk-block-accordion__heading\" data-v=\"4\" data-block-id=\"0dec7f3\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-0dec7f3-container stk-hover-parent\"><div class=\"stk-block-content stk-inner-blocks stk-0dec7f3-inner-blocks\">\n<div class=\"wp-block-stackable-icon-label stk-block-icon-label stk-block stk-fb760f4\" data-block-id=\"fb760f4\"><div class=\"stk-row stk-inner-blocks stk-block-content\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-3ca8180\" id=\"actividades\" data-block-id=\"3ca8180\"><h5 class=\"stk-block-heading__text\">Activities<\/h5><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon stk-block-icon stk-block stk-d8297e3\" data-block-id=\"d8297e3\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg style=\"height:0;width:0\"><defs><lineargradient id=\"linear-gradient-d8297e3\" x1=\"0\" x2=\"100%\" y1=\"0\" y2=\"0\"><stop offset=\"0%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-d-8297-e-3-color-1)\"><\/stop><stop offset=\"100%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-d-8297-e-3-color-2)\"><\/stop><\/lineargradient><\/defs><\/svg><svg data-prefix=\"fas\" data-icon=\"chevron-down\" class=\"svg-inline--fa fa-chevron-down fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 448 512\" aria-hidden=\"true\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M207.029 381.476L12.686 187.132c-9.373-9.373-9.373-24.569 0-33.941l22.667-22.667c9.357-9.357 24.522-9.375 33.901-.04L224 284.505l154.745-154.021c9.379-9.335 24.544-9.317 33.901.04l22.667 22.667c9.373 9.373 9.373 24.569 0 33.941L240.971 381.476c-9.373 9.372-24.569 9.372-33.942 0z\"><\/path><\/svg><\/div><\/span><\/div>\n<\/div><\/div>\n<\/div><\/div><\/summary>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-f2be916 stk-block-accordion__content\" data-v=\"4\" data-block-id=\"f2be916\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-f2be916-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-f2be916-inner-blocks\">\n<div class=\"wp-block-stackable-icon-list stk-block-icon-list stk-block stk-b3f3e12\" data-block-id=\"b3f3e12\"><svg style=\"display:none\"><defs><g id=\"stk-icon-list__icon-svg-def-b3f3e12\"><svg xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 190 190\"><polygon points=\"173.8,28.4 60.4,141.8 15.7,97.2 5.1,107.8 60.4,163 184.4,39 173.8,28.4\"\/><\/svg><\/g><\/defs><\/svg><ul class=\"stk-block-icon-list__ul stk-block-icon-list--column\">\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-1a4a048\" data-block-id=\"1a4a048\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-b3f3e12\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>Project Requirements Definition:<\/strong> Establish the functionality specifications, space constraints, and operating environmental conditions.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-09353ad\" data-block-id=\"09353ad\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-b3f3e12\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>Selection of Electrical and Electronic Components:<\/strong> Selection of active and passive components, availability and cost research, review of technical specifications.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-c59db67\" data-block-id=\"c59db67\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-b3f3e12\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>Schematic Design:<\/strong> Creation of electronic schematics using Altium<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-44cf376\" data-block-id=\"44cf376\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-b3f3e12\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>Analysis of Best Layout for PCB:<\/strong> Analysis of component placement on PCB and optimal routing of tracks between electronic components to ensure signal integrity in the circuit.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-618d787\" data-block-id=\"618d787\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-b3f3e12\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>Design Verification:<\/strong> Perform the Design Rule Check to ensure compliance with design rules.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-7f7a15a\" data-block-id=\"7f7a15a\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-b3f3e12\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>Firmware Development:<\/strong> For microcontroller-based designs, operational firmware design is carried out. Development of APIs in different microcontrollers for the design of structured and modular firmware. Design of bootloaders for proper remote firmware updates through digital devices with Internet communication. <\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-c1f5ead\" data-block-id=\"c1f5ead\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-b3f3e12\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"> <strong>Prototype Testing: <\/strong>Conducting functional tests and error correction.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-c466271\" data-block-id=\"c466271\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-b3f3e12\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>Project Documentation:<\/strong> Document all important aspects throughout the project design process, from the initial idea to the final tests.<\/span><\/div><\/li>\n<\/ul><\/div>\n<\/div><\/div><\/div>\n<\/details>\n\n\n\n<details class=\"wp-block-stackable-accordion stk-block-accordion stk-inner-blocks stk-block-content stk-block stk-0a51bab is-style-default\" data-block-id=\"0a51bab\">\n<summary class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-98a2dfe stk--container-small stk-block-accordion__heading\" data-v=\"4\" data-block-id=\"98a2dfe\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-98a2dfe-container stk-hover-parent\"><div class=\"stk-block-content stk-inner-blocks stk-98a2dfe-inner-blocks\">\n<div class=\"wp-block-stackable-icon-label stk-block-icon-label stk-block stk-a10ce50\" data-block-id=\"a10ce50\"><div class=\"stk-row stk-inner-blocks stk-block-content\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-7c90248\" id=\"principales-proyectos-desarrollados\" data-block-id=\"7c90248\"><h5 class=\"stk-block-heading__text\">Main Development Projects<\/h5><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon stk-block-icon stk-block stk-567ca97\" data-block-id=\"567ca97\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg style=\"height:0;width:0\"><defs><lineargradient id=\"linear-gradient-567ca97\" x1=\"0\" x2=\"100%\" y1=\"0\" y2=\"0\"><stop offset=\"0%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-567-ca-97-color-1)\"><\/stop><stop offset=\"100%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-567-ca-97-color-2)\"><\/stop><\/lineargradient><\/defs><\/svg><svg data-prefix=\"fas\" data-icon=\"chevron-down\" class=\"svg-inline--fa fa-chevron-down fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 448 512\" aria-hidden=\"true\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M207.029 381.476L12.686 187.132c-9.373-9.373-9.373-24.569 0-33.941l22.667-22.667c9.357-9.357 24.522-9.375 33.901-.04L224 284.505l154.745-154.021c9.379-9.335 24.544-9.317 33.901.04l22.667 22.667c9.373 9.373 9.373 24.569 0 33.941L240.971 381.476c-9.373 9.372-24.569 9.372-33.942 0z\"><\/path><\/svg><\/div><\/span><\/div>\n<\/div><\/div>\n<\/div><\/div><\/summary>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-5fdb64f stk-block-accordion__content\" data-v=\"4\" data-block-id=\"5fdb64f\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-5fdb64f-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-5fdb64f-inner-blocks\">\n<div class=\"wp-block-stackable-icon-list stk-block-icon-list stk-block stk-4971b62\" data-block-id=\"4971b62\"><svg style=\"display:none\"><defs><g id=\"stk-icon-list__icon-svg-def-4971b62\"><svg xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 190 190\"><polygon points=\"173.8,28.4 60.4,141.8 15.7,97.2 5.1,107.8 60.4,163 184.4,39 173.8,28.4\"\/><\/svg><\/g><\/defs><\/svg><ul class=\"stk-block-icon-list__ul stk-block-icon-list--column\">\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-9616199\" data-block-id=\"9616199\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-4971b62\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>Fuel Level Sensor<\/strong><br>This sensor monitors the fuel level contained in the tanks of semi-trucks. The sensor is based on an STM32F103RCT6 microcontroller. The fuel level information is sent via an RS-485 communication protocol to a data collection and processing unit called Linker. Within the microcontroller, the following peripherals have been enabled and configured to establish communication with different devices: a) USART: To implement RS-485 communication between the sensor and the Linker; b) SPI: To communicate the microprocessor with an external Flash memory unit; and c) I2C: To communicate the microprocessor with an accelerometer. A custom \u201cbootloader\u201d was implemented in this sensor to provide the system with the capability to perform over-the-air firmware updates through the Linker device. The Linker sends the new firmware data for the fuel sensor through RS-485 communication. This data is thoroughly analyzed through CRC checks, and if all the data is completely adequate, the new firmware is written into the microcontroller\u2019s program memory. The microcontroller firmware was developed in C language within the STM32CubeIDE, using the .ioc file for proper microcontroller configuration and the use of ST\u2019s HAL APIs.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-a58d9ec\" data-block-id=\"a58d9ec\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-4971b62\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>Truck Computer Emulator:<\/strong><br> This project is based on the STM32F103RCT6 microcontroller. Its purpose is to send CANBUS frames emitted by a truck computer so that they can be received by a data collection and processing unit called Linker. The microcontroller firmware was developed in C language within the STM32CubeIDE, using the .ioc file for proper microcontroller configuration and the use of ST's HAL APIs.<\/span><\/div><\/li>\n<\/ul><\/div>\n<\/div><\/div><\/div>\n<\/details>\n<\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon-box stk-block-icon-box stk-block stk-af786a8\" data-v=\"2\" data-block-id=\"af786a8\"><style>.stk-af786a8{margin-bottom:50px !important}<\/style><div class=\"stk-block-content stk-inner-blocks stk-block-icon-box__content stk-container stk-af786a8-container stk--no-background stk--no-padding\">\n<div class=\"wp-block-stackable-icon-label stk-block-icon-label stk-block stk-ed92760\" data-block-id=\"ed92760\"><style>.stk-ed92760{margin-bottom:0px !important}<\/style><div class=\"stk-row stk-inner-blocks stk-block-content\">\n<div class=\"wp-block-stackable-icon stk-block-icon has-text-align-left stk-block stk-7035bf2\" data-block-id=\"7035bf2\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg style=\"height:0;width:0\"><defs><lineargradient id=\"linear-gradient-7035bf2\" x1=\"0\" x2=\"100%\" y1=\"0\" y2=\"0\"><stop offset=\"0%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-7035-bf-2-color-1)\"><\/stop><stop offset=\"100%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-7035-bf-2-color-2)\"><\/stop><\/lineargradient><\/defs><\/svg><svg xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 448 512\" aria-hidden=\"true\" width=\"32\" height=\"32\"><path d=\"M32 0C14.3 0 0 14.3 0 32V192v96c0 17.7 14.3 32 32 32s32-14.3 32-32V224h50.7l128 128L137.4 457.4c-12.5 12.5-12.5 32.8 0 45.3s32.8 12.5 45.3 0L288 397.3 393.4 502.6c12.5 12.5 32.8 12.5 45.3 0s12.5-32.8 0-45.3L333.3 352 438.6 246.6c12.5-12.5 12.5-32.8 0-45.3s-32.8-12.5-45.3 0L288 306.7l-85.8-85.8C251.4 209.1 288 164.8 288 112C288 50.1 237.9 0 176 0H32zM176 160H64V64H176c26.5 0 48 21.5 48 48s-21.5 48-48 48z\"><\/path><\/svg><\/div><\/span><\/div>\n\n\n\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-2584cf3\" id=\"compania-mexicana-de-radiologia-cmr\" data-block-id=\"2584cf3\"><h4 class=\"stk-block-heading__text\">Compa\u00f1ia Mexicana de Radiolog\u00eda (CMR)<\/h4><\/div>\n<\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-0c93fe0\" data-block-id=\"0c93fe0\"><p class=\"stk-block-text__text has-text-align-justify\"><strong>Job Position:<\/strong> Project Leader.<br><strong>Immediate Supervisor:<\/strong> M.Sc. Jes\u00fas Medina Lopez.<br><strong>Employment Period:<\/strong> 2014-2017<br><strong>General Description:<\/strong> Design power electronic systems for the control of X-ray machines for medical applications. The designs are based in the integration of existing semiconductor devices on the market that meet the initial design requirements. <\/p><\/div>\n\n\n\n<details class=\"wp-block-stackable-accordion stk-block-accordion stk-inner-blocks stk-block-content stk-block stk-6f052bd is-style-default\" data-block-id=\"6f052bd\"><style>.stk-6f052bd{margin-bottom:0px !important}<\/style>\n<summary class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-76665d9 stk--container-small stk-block-accordion__heading\" data-v=\"4\" data-block-id=\"76665d9\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-76665d9-container stk-hover-parent\"><div class=\"stk-block-content stk-inner-blocks stk-76665d9-inner-blocks\">\n<div class=\"wp-block-stackable-icon-label stk-block-icon-label stk-block stk-ffa748b\" data-block-id=\"ffa748b\"><div class=\"stk-row stk-inner-blocks stk-block-content\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-374837b\" id=\"actividades\" data-block-id=\"374837b\"><h5 class=\"stk-block-heading__text\">Activities<\/h5><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon stk-block-icon stk-block stk-8d3ff23\" data-block-id=\"8d3ff23\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg style=\"height:0;width:0\"><defs><lineargradient id=\"linear-gradient-8d3ff23\" x1=\"0\" x2=\"100%\" y1=\"0\" y2=\"0\"><stop offset=\"0%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-8-d-3-ff-23-color-1)\"><\/stop><stop offset=\"100%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-8-d-3-ff-23-color-2)\"><\/stop><\/lineargradient><\/defs><\/svg><svg data-prefix=\"fas\" data-icon=\"chevron-down\" class=\"svg-inline--fa fa-chevron-down fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 448 512\" aria-hidden=\"true\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M207.029 381.476L12.686 187.132c-9.373-9.373-9.373-24.569 0-33.941l22.667-22.667c9.357-9.357 24.522-9.375 33.901-.04L224 284.505l154.745-154.021c9.379-9.335 24.544-9.317 33.901.04l22.667 22.667c9.373 9.373 9.373 24.569 0 33.941L240.971 381.476c-9.373 9.372-24.569 9.372-33.942 0z\"><\/path><\/svg><\/div><\/span><\/div>\n<\/div><\/div>\n<\/div><\/div><\/summary>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-c58bdcd stk-block-accordion__content\" data-v=\"4\" data-block-id=\"c58bdcd\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-c58bdcd-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-c58bdcd-inner-blocks\">\n<div class=\"wp-block-stackable-icon-list stk-block-icon-list stk-block stk-8540168\" data-block-id=\"8540168\"><svg style=\"display:none\"><defs><g id=\"stk-icon-list__icon-svg-def-8540168\"><svg xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 190 190\"><polygon points=\"173.8,28.4 60.4,141.8 15.7,97.2 5.1,107.8 60.4,163 184.4,39 173.8,28.4\"\/><\/svg><\/g><\/defs><\/svg><ul class=\"stk-block-icon-list__ul stk-block-icon-list--column\">\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-c9b50c0\" data-block-id=\"c9b50c0\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-8540168\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>Project Requirements Definition:<\/strong> Establish the functionality specifications, space constraints, and operating environmental conditions.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-fe188ac\" data-block-id=\"fe188ac\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-8540168\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>Selection of Electrical and Electronic Components:<\/strong> Selection of both low and high-power active and passive components, availability and cost research, review of the technical specifications of each device.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-336e868\" data-block-id=\"336e868\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-8540168\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>Schematic Design:<\/strong> Creation of electronic schematics using Altium<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-252b3ad\" data-block-id=\"252b3ad\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-8540168\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>Dise\u00f1o de PCB:<\/strong> Analysis of component placement on PCB and optimal routing of tracks between electronic components to ensure signal integrity in the circuit.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-6efac27\" data-block-id=\"6efac27\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-8540168\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>Design Verification:<\/strong> Perform the Design Rule Check to ensure compliance with design rules.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-c4a48fa\" data-block-id=\"c4a48fa\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-8540168\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>Firmware Development:<\/strong> All designs were based on microcontrollers, for which operational firmware design also had to be carried out.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-5fa7b60\" data-block-id=\"5fa7b60\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-8540168\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\">Prototipado: Env\u00edo del dise\u00f1o de PCB para su fabricaci\u00f3n y montaje de componentes electr\u00f3nicos.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-0418d14\" data-block-id=\"0418d14\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-8540168\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"> <strong>Prototype Testing: <\/strong>Conducting functional tests and error correction.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-f9abb8d\" data-block-id=\"f9abb8d\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-8540168\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>Project Documentation:<\/strong> Prepare all the necessary documentation for production: Bills of Materials (BOM), Gerber files, Assembly diagrams, and relevant technical specifications of the project.<\/span><\/div><\/li>\n<\/ul><\/div>\n<\/div><\/div><\/div>\n<\/details>\n\n\n\n<details class=\"wp-block-stackable-accordion stk-block-accordion stk-inner-blocks stk-block-content stk-block stk-74bca58 is-style-default\" data-block-id=\"74bca58\">\n<summary class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-1092aa5 stk--container-small stk-block-accordion__heading\" data-v=\"4\" data-block-id=\"1092aa5\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-1092aa5-container stk-hover-parent\"><div class=\"stk-block-content stk-inner-blocks stk-1092aa5-inner-blocks\">\n<div class=\"wp-block-stackable-icon-label stk-block-icon-label stk-block stk-536f124\" data-block-id=\"536f124\"><div class=\"stk-row stk-inner-blocks stk-block-content\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-ac1afc1\" id=\"principales-proyectos-desarrollados\" data-block-id=\"ac1afc1\"><h5 class=\"stk-block-heading__text\">Main Development Projects<\/h5><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon stk-block-icon stk-block stk-0f95a3f\" data-block-id=\"0f95a3f\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg style=\"height:0;width:0\"><defs><lineargradient id=\"linear-gradient-0f95a3f\" x1=\"0\" x2=\"100%\" y1=\"0\" y2=\"0\"><stop offset=\"0%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-0-f-95-a-3-f-color-1)\"><\/stop><stop offset=\"100%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-0-f-95-a-3-f-color-2)\"><\/stop><\/lineargradient><\/defs><\/svg><svg data-prefix=\"fas\" data-icon=\"chevron-down\" class=\"svg-inline--fa fa-chevron-down fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 448 512\" aria-hidden=\"true\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M207.029 381.476L12.686 187.132c-9.373-9.373-9.373-24.569 0-33.941l22.667-22.667c9.357-9.357 24.522-9.375 33.901-.04L224 284.505l154.745-154.021c9.379-9.335 24.544-9.317 33.901.04l22.667 22.667c9.373 9.373 9.373 24.569 0 33.941L240.971 381.476c-9.373 9.372-24.569 9.372-33.942 0z\"><\/path><\/svg><\/div><\/span><\/div>\n<\/div><\/div>\n<\/div><\/div><\/summary>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-5a52318 stk-block-accordion__content\" data-v=\"4\" data-block-id=\"5a52318\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-5a52318-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-5a52318-inner-blocks\">\n<div class=\"wp-block-stackable-icon-list stk-block-icon-list stk-block stk-3f722e8\" data-block-id=\"3f722e8\"><svg style=\"display:none\"><defs><g id=\"stk-icon-list__icon-svg-def-3f722e8\"><svg xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 190 190\"><polygon points=\"173.8,28.4 60.4,141.8 15.7,97.2 5.1,107.8 60.4,163 184.4,39 173.8,28.4\"\/><\/svg><\/g><\/defs><\/svg><ul class=\"stk-block-icon-list__ul stk-block-icon-list--column\">\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-7c1c1cc\" data-block-id=\"7c1c1cc\"><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-3f722e8\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>High Speed Starter<\/strong><br>A high-speed starter is a system that controls the rotational speed of the anode in X-ray tubes. This system is responsible for rotating the anode at two different speeds: Low speed, 3200 rpm; and high speed, 10000 rpm. To achieve such operation, SPWM techniques have been implemented in a digital control, which is based on a 32-bit microcontroller from Atmel. The digital control determines the activation of six power IGBTs contained within an Intelligent Power Module (IPM). The U, V, and W outputs of this module directly control the terminals of the motor that rotates the anode. The microcontroller firmware was developed in C language within the Atmel Studio software.<\/span><\/div><\/li>\n\n\n\n<li class=\"wp-block-stackable-icon-list-item stk-block-icon-list-item stk-block stk-a36df17\" data-block-id=\"a36df17\"><style>.stk-a36df17 .stk-block-icon-list-item__text{text-shadow:none !important}<\/style><div class=\"stk-block-icon-list-item__content\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" width=\"32\" height=\"32\"><use xlink:href=\"#stk-icon-list__icon-svg-def-3f722e8\"><\/use><\/svg><\/div><\/span><span class=\"stk-block-icon-list-item__text\"><strong>50KW High Frequency X-ray Generatror<\/strong><br>The high-frequency X-ray generator controls three basic radiographic parameters: Kilo-Voltage (KV), current (mA), and exposure time. KV and mA are applied to the X-ray tube to produce the desired radiation. The control of the radiographic parameters was implemented with two PCBs based on Atmel microcontrollers. In this project, different communication protocols have been used, such as RS232, CAN, I2C, and SPI.<\/span><\/div><\/li>\n<\/ul><\/div>\n<\/div><\/div><\/div>\n<\/details>\n<\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon-box stk-block-icon-box stk-block stk-e16d1a5\" data-v=\"2\" data-block-id=\"e16d1a5\"><div class=\"stk-block-content stk-inner-blocks stk-block-icon-box__content stk-container stk-e16d1a5-container stk--no-background stk--no-padding\">\n<div class=\"wp-block-stackable-icon-label stk-block-icon-label stk-block stk-071b335\" data-block-id=\"071b335\"><style>.stk-071b335{margin-bottom:0px !important}<\/style><div class=\"stk-row stk-inner-blocks stk-block-content\">\n<div class=\"wp-block-stackable-icon stk-block-icon has-text-align-left stk-block stk-a9bcc97\" data-block-id=\"a9bcc97\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg style=\"height:0;width:0\"><defs><lineargradient id=\"linear-gradient-a9bcc97\" x1=\"0\" x2=\"100%\" y1=\"0\" y2=\"0\"><stop offset=\"0%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-a-9-bcc-97-color-1)\"><\/stop><stop offset=\"100%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-a-9-bcc-97-color-2)\"><\/stop><\/lineargradient><\/defs><\/svg><svg xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 640 512\" aria-hidden=\"true\" width=\"32\" height=\"32\"><path d=\"M320 32c-8.1 0-16.1 1.4-23.7 4.1L15.8 137.4C6.3 140.9 0 149.9 0 160s6.3 19.1 15.8 22.6l57.9 20.9C57.3 229.3 48 259.8 48 291.9v28.1c0 28.4-10.8 57.7-22.3 80.8c-6.5 13-13.9 25.8-22.5 37.6C0 442.7-.9 448.3 .9 453.4s6 8.9 11.2 10.2l64 16c4.2 1.1 8.7 .3 12.4-2s6.3-6.1 7.1-10.4c8.6-42.8 4.3-81.2-2.1-108.7C90.3 344.3 86 329.8 80 316.5V291.9c0-30.2 10.2-58.7 27.9-81.5c12.9-15.5 29.6-28 49.2-35.7l157-61.7c8.2-3.2 17.5 .8 20.7 9s-.8 17.5-9 20.7l-157 61.7c-12.4 4.9-23.3 12.4-32.2 21.6l159.6 57.6c7.6 2.7 15.6 4.1 23.7 4.1s16.1-1.4 23.7-4.1L624.2 182.6c9.5-3.4 15.8-12.5 15.8-22.6s-6.3-19.1-15.8-22.6L343.7 36.1C336.1 33.4 328.1 32 320 32zM128 408c0 35.3 86 72 192 72s192-36.7 192-72L496.7 262.6 354.5 314c-11.1 4-22.8 6-34.5 6s-23.5-2-34.5-6L143.3 262.6 128 408z\"><\/path><\/svg><\/div><\/span><\/div>\n\n\n\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-6fee7c8\" id=\"inesc-id-instituto-superior-tecnico-de-lisboa\" data-block-id=\"6fee7c8\"><h4 class=\"stk-block-heading__text\">INESC-ID. Instituto Superior T\u00e9cnico de Lisboa<\/h4><\/div>\n<\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-4138efb\" data-block-id=\"4138efb\"><p class=\"stk-block-text__text\"><strong>Job Position:<\/strong> Research Intership <br><strong>Immediate Supervisors:<\/strong> Marcelino Bicho dos Santos, Ph. D. &amp; Joao Paulo Teixeira, Ph. D.<br><strong>Intership Period:<\/strong> 2008-2009<br><strong>General Description:<\/strong> Research internship sponsored by a scholarship from the ALFA-NICROM project. During this research internship, radiation-hardened memory blocks were developed. Additionally, an aging sensor for digital systems was developed. All these developments were considered for use within digital chips in 0.35-micron manufacturing technologies.<\/p><\/div>\n<\/div><\/div>\n<\/div><\/div><\/div>\n<\/div><\/div>\n<\/div><\/div><\/div>\n<\/details>\n\n\n\n<details class=\"wp-block-stackable-accordion stk-block-accordion stk-inner-blocks stk-block-content stk-block stk-ae522ae is-style-default\" data-block-id=\"ae522ae\">\n<summary class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-1a2d6a6 stk--container-small stk-block-accordion__heading\" data-v=\"4\" data-block-id=\"1a2d6a6\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-1a2d6a6-container stk-hover-parent\"><div class=\"stk-block-content stk-inner-blocks stk-1a2d6a6-inner-blocks\">\n<div class=\"wp-block-stackable-icon-label stk-block-icon-label stk-block stk-cdf0975\" data-block-id=\"cdf0975\"><div class=\"stk-row stk-inner-blocks stk-block-content\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-cbaaf53\" id=\"articulos-de-investigacion\" data-block-id=\"cbaaf53\"><h2 class=\"stk-block-heading__text\">Scientific Research Articles<\/h2><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon stk-block-icon stk-block stk-7f07348\" data-block-id=\"7f07348\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg style=\"height:0;width:0\"><defs><lineargradient id=\"linear-gradient-7f07348\" x1=\"0\" x2=\"100%\" y1=\"0\" y2=\"0\"><stop offset=\"0%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-7-f-07348-color-1)\"><\/stop><stop offset=\"100%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-7-f-07348-color-2)\"><\/stop><\/lineargradient><\/defs><\/svg><svg data-prefix=\"fas\" data-icon=\"chevron-down\" class=\"svg-inline--fa fa-chevron-down fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 448 512\" aria-hidden=\"true\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M207.029 381.476L12.686 187.132c-9.373-9.373-9.373-24.569 0-33.941l22.667-22.667c9.357-9.357 24.522-9.375 33.901-.04L224 284.505l154.745-154.021c9.379-9.335 24.544-9.317 33.901.04l22.667 22.667c9.373 9.373 9.373 24.569 0 33.941L240.971 381.476c-9.373 9.372-24.569 9.372-33.942 0z\"><\/path><\/svg><\/div><\/span><\/div>\n<\/div><\/div>\n<\/div><\/div><\/summary>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-7d4ebfc stk-block-accordion__content\" data-v=\"4\" data-block-id=\"7d4ebfc\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-7d4ebfc-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-7d4ebfc-inner-blocks\">\n<div class=\"wp-block-stackable-columns alignwide stk-block-columns stk-block stk-168a11f\" data-block-id=\"168a11f\"><div class=\"stk-row stk-inner-blocks stk-block-content stk-content-align stk-168a11f-column\">\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-2a3f480\" data-v=\"4\" data-block-id=\"2a3f480\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-2a3f480-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-2a3f480-inner-blocks\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-d830504\" id=\"revistas-y-journals-cientificos\" data-block-id=\"d830504\"><style>.stk-d830504{margin-bottom:16px !important}<\/style><h4 class=\"stk-block-heading__text has-text-align-center\">Scientific Magazines and Journals<\/h4><\/div>\n\n\n\n<div class=\"wp-block-stackable-feature-grid alignwide stk-block-feature-grid stk-block-columns stk-block stk-b2795c5 is-style-large-mid\" data-block-id=\"b2795c5\"><style>.stk-b2795c5 .stk--block-align-b2795c5{align-items:center !important}.stk-b2795c5-column{--stk-column-gap:32px !important}@media screen and (max-width:767px){.stk-b2795c5-column{row-gap:24px !important}}<\/style><div class=\"stk-row stk-inner-blocks has-text-align-center stk--block-align-b2795c5 stk-block-content stk-content-align stk-b2795c5-column alignwide\">\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-50f4ecd\" data-v=\"4\" data-block-id=\"50f4ecd\"><style>.stk-50f4ecd{align-self:flex-start !important}.stk-50f4ecd-inner-blocks{justify-content:center !important}.stk-50f4ecd-container{display:flex !important}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-50f4ecd-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-50f4ecd-inner-blocks\">\n<div class=\"wp-block-stackable-image stk-block-image stk-block stk-8015231\" data-block-id=\"8015231\"><style>.stk-8015231 .stk-img-wrapper{width:50% !important}<\/style><figure><span class=\"stk-img-wrapper stk-image--shape-stretch\"><img loading=\"lazy\" decoding=\"async\" class=\"stk-img wp-image-989\" src=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Journal-1.webp\" width=\"158\" height=\"209\"\/><\/span><\/figure><\/div>\n\n\n\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-6399d9f\" id=\"1-process-variations-aware-statistical-analysis-framework-for-aging-sensor-insertion\" data-block-id=\"6399d9f\"><h5 class=\"stk-block-heading__text has-text-align-center\">1. Process Variations-Aware Statistical Analysis Framework for Aging Sensor Insertion<\/h5><\/div>\n\n\n\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-4e2105d\" data-block-id=\"4e2105d\"><style>.stk-4e2105d{margin-bottom:48px !important}<\/style><p class=\"stk-block-text__text has-text-align-justify\"><strong><em>Abstract:<\/em><\/strong> As process technology continues to shrink, Process Variations and Aging effects have an increasing impact on the reliability and performance of manufactured circuits. Aging effects produce performance degradation as time progresses. This degradation rate depends on: a) Operational conditions and b) Static technological parameters defined in the fabrication process. Moreover, performance of electronic systems for safety-critical applications which operate for many years in harsh environments are more prompt to be impacted by aging. In order to guarantee a safe operation in advanced technologies, aging monitoring should be performed on chip using built-in aging sensors. The purpose of this work is to present a methodology to determine the correct location for aging sensor insertion, considering the combined impact of process variations (PV) and aging effects. In order to implement the methodology a path-based Statistical Timing Analysis framework and tools have been developed. It is shown that delay path reordering, asssociated with PV and Aging, may justify the insertion of a few aditional sensors to cover abnormal delays of signal paths that become critical under long system operation<\/p><\/div>\n\n\n\n<div class=\"wp-block-stackable-button-group stk-block-button-group stk-block stk-3f797bc\" data-block-id=\"3f797bc\"><div class=\"stk-row stk-inner-blocks stk-block-content stk-button-group\">\n<div class=\"wp-block-stackable-button stk-block-button is-style-plain stk-block stk-5d0d897\" data-block-id=\"5d0d897\"><style>.stk-5d0d897 .stk-button{background:transparent !important}<\/style><a class=\"stk-link stk-button stk--hover-effect-darken\" href=\"https:\/\/link.springer.com\/article\/10.1007\/s10836-013-5358-z\" target=\"_blank\" rel=\"noreferrer noopener\"><span class=\"stk-button__inner-text\">Go to Paper in Journal<\/span><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" data-prefix=\"fas\" data-icon=\"arrow-right\" class=\"svg-inline--fa fa-arrow-right fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 448 512\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M190.5 66.9l22.2-22.2c9.4-9.4 24.6-9.4 33.9 0L441 239c9.4 9.4 9.4 24.6 0 33.9L246.6 467.3c-9.4 9.4-24.6 9.4-33.9 0l-22.2-22.2c-9.5-9.5-9.3-25 .4-34.3L311.4 296H24c-13.3 0-24-10.7-24-24v-32c0-13.3 10.7-24 24-24h287.4L190.9 101.2c-9.8-9.3-10-24.8-.4-34.3z\"><\/path><\/svg><\/div><\/span><\/a><\/div>\n<\/div><\/div>\n<\/div><\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-cf6cab9\" data-v=\"4\" data-block-id=\"cf6cab9\"><style>.stk-cf6cab9{align-self:flex-start !important}.stk-cf6cab9-inner-blocks{justify-content:center !important}.stk-cf6cab9-container{display:flex !important}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-cf6cab9-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-cf6cab9-inner-blocks\">\n<div class=\"wp-block-stackable-image stk-block-image stk-block stk-4694227\" data-block-id=\"4694227\"><style>.stk-4694227 .stk-img-wrapper{width:50% !important}<\/style><figure><span class=\"stk-img-wrapper stk-image--shape-stretch\"><img loading=\"lazy\" decoding=\"async\" class=\"stk-img wp-image-995\" src=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Journal-2.webp\" width=\"115\" height=\"152\"\/><\/span><\/figure><\/div>\n\n\n\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-5dda1a4\" id=\"2-delay-sensing-for-long-term-variations-and-defects-monitoring-in-safety-critical-applications\" data-block-id=\"5dda1a4\"><h5 class=\"stk-block-heading__text has-text-align-center\">2. Delay sensing for long-term variations and defects monitoring in safety-critical applications<\/h5><\/div>\n\n\n\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-adc5faf\" data-block-id=\"adc5faf\"><style>.stk-adc5faf{margin-bottom:48px !important}<\/style><p class=\"stk-block-text__text has-text-align-justify\"><strong><em>Abstract:<\/em><\/strong> The impact of parametric variations on digital circuit performance is increasing in nanometer Integrated Circuits (IC), namely of Process, power supply Voltage and Temperature (PVT) variations. Moreover, circuit aging also impacts circuit performance, especially due to Negative Bias Temperature Instability (NBTI) effect. A growing number of physical defects manifest themselves as delay faults (at production, or during product lifetime). On-chip, on-line delay monitoring, as a circuit failure prediction technique, can be an attractive solution to guarantee correct operation in safety\u2013critical applications. Safe operation can be monitored, by predictive delay fault detection. A delay monitoring methodology and a novel delay sensor (to be selectively inserted in key locations in the design and to be activated according to user\u2019s requirements) is proposed, and a 65\u00a0nm design is presented. The proposed sensor is programmable, allowing delay monitoring for a wide range of delay values, and has been optimized to exhibit low sensitivity to PVT and aging-induced variations. Two MOSFET models\u2014BPTM and ST\u2014have been used. As abnormal delays can be monitored, regardless of their origin, both parametric variations and physical defects impact on circuit performance can be identified. Simulation results show that the sensor is effective in identifying such abnormal delays, due to NBTI-induced aging and to resistive open defects.<\/p><\/div>\n\n\n\n<div class=\"wp-block-stackable-button-group stk-block-button-group stk-block stk-041ef3a\" data-block-id=\"041ef3a\"><div class=\"stk-row stk-inner-blocks stk-block-content stk-button-group\">\n<div class=\"wp-block-stackable-button stk-block-button is-style-plain stk-block stk-f427bdc\" data-block-id=\"f427bdc\"><style>.stk-f427bdc .stk-button{background:transparent !important}<\/style><a class=\"stk-link stk-button stk--hover-effect-darken\" href=\"https:\/\/link.springer.com\/article\/10.1007\/s10470-011-9789-0\" target=\"_blank\" rel=\"noreferrer noopener\"><span class=\"stk-button__inner-text\">Go to Paper in Journal<\/span><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" data-prefix=\"fas\" data-icon=\"arrow-right\" class=\"svg-inline--fa fa-arrow-right fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 448 512\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M190.5 66.9l22.2-22.2c9.4-9.4 24.6-9.4 33.9 0L441 239c9.4 9.4 9.4 24.6 0 33.9L246.6 467.3c-9.4 9.4-24.6 9.4-33.9 0l-22.2-22.2c-9.5-9.5-9.3-25 .4-34.3L311.4 296H24c-13.3 0-24-10.7-24-24v-32c0-13.3 10.7-24 24-24h287.4L190.9 101.2c-9.8-9.3-10-24.8-.4-34.3z\"><\/path><\/svg><\/div><\/span><\/a><\/div>\n<\/div><\/div>\n<\/div><\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-ae7d76b\" data-v=\"4\" data-block-id=\"ae7d76b\"><style>.stk-ae7d76b{align-self:flex-start !important}.stk-ae7d76b-inner-blocks{justify-content:center !important}.stk-ae7d76b-container{display:flex !important}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-ae7d76b-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-ae7d76b-inner-blocks\">\n<div class=\"wp-block-stackable-image stk-block-image stk-block stk-dc8dc39\" data-block-id=\"dc8dc39\"><style>.stk-dc8dc39 .stk-img-wrapper{width:55% !important}<\/style><figure><span class=\"stk-img-wrapper stk-image--shape-stretch\"><img loading=\"lazy\" decoding=\"async\" class=\"stk-img wp-image-1272\" src=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/IEEE.jpg\" width=\"742\" height=\"884\" srcset=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/IEEE.jpg 742w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/IEEE-252x300.jpg 252w\" sizes=\"auto, (max-width: 742px) 100vw, 742px\" \/><\/span><\/figure><\/div>\n\n\n\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-1fe19ed\" id=\"3-testing-of-stuck-open-faults-in-nanometer-technologies\" data-block-id=\"1fe19ed\"><h5 class=\"stk-block-heading__text has-text-align-center\">3. Testing of Stuck Open Faults in Nanometer Technologies<\/h5><\/div>\n\n\n\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-d3da4ae\" data-block-id=\"d3da4ae\"><style>.stk-d3da4ae{margin-bottom:48px !important}<\/style><p class=\"stk-block-text__text has-text-align-justify\"><strong><em>Abstract:<\/em><\/strong> Opens have become an important defect mechanism in modern technologies. An open defect type of significant concern is called the CMOS stuck-open fault (SOF). SOF are dificult to test because they require at least a two-vector sequence. Unfortunately, test detection of this defect is made by chance: either from a lucky sequence of vectors in a functional, stuck at fault, or delay fault voltage-based test set, or by chance in an IDDQ test. Failure analysis can experience seemingly contradictory measurements making the analysis frustrating. The presence of SOFs may make some transition faults invalid. This paper shows how ICs implemented in technologies having low-signal-node capacitance that interact with transsitor leakage currents can alter classic SOF behavior, which presens an even more complex detection challenge. The results show that leakage currents in SOF output nodes introduce more variables that further complcate detection. Results also show that normal IC noise may introduce a noisy output response that may or may not be correct.<\/p><\/div>\n\n\n\n<div class=\"wp-block-stackable-button-group stk-block-button-group stk-block stk-4c9988c\" data-block-id=\"4c9988c\"><div class=\"stk-row stk-inner-blocks stk-block-content stk-button-group\">\n<div class=\"wp-block-stackable-button stk-block-button is-style-plain stk-block stk-7f1bdc4\" data-block-id=\"7f1bdc4\"><style>.stk-7f1bdc4 .stk-button{background:transparent !important}<\/style><a class=\"stk-link stk-button stk--hover-effect-darken\" href=\"https:\/\/ieeexplore.ieee.org\/document\/6222408\" target=\"_blank\" rel=\"noreferrer noopener\"><span class=\"stk-button__inner-text\">Go to Paper in Magazine<\/span><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" data-prefix=\"fas\" data-icon=\"arrow-right\" class=\"svg-inline--fa fa-arrow-right fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 448 512\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M190.5 66.9l22.2-22.2c9.4-9.4 24.6-9.4 33.9 0L441 239c9.4 9.4 9.4 24.6 0 33.9L246.6 467.3c-9.4 9.4-24.6 9.4-33.9 0l-22.2-22.2c-9.5-9.5-9.3-25 .4-34.3L311.4 296H24c-13.3 0-24-10.7-24-24v-32c0-13.3 10.7-24 24-24h287.4L190.9 101.2c-9.8-9.3-10-24.8-.4-34.3z\"><\/path><\/svg><\/div><\/span><\/a><\/div>\n<\/div><\/div>\n<\/div><\/div><\/div>\n<\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-8c9ddfb\" id=\"conferencias-internacionales\" data-block-id=\"8c9ddfb\"><style>.stk-8c9ddfb{margin-bottom:16px !important}<\/style><h4 class=\"stk-block-heading__text has-text-align-center\">International Conferences:<\/h4><\/div>\n\n\n\n<div class=\"wp-block-stackable-feature-grid alignwide stk-block-feature-grid stk-block-columns stk-block stk-f1419e3 is-style-large-mid\" data-block-id=\"f1419e3\"><style>.stk-f1419e3 .stk--block-align-f1419e3{align-items:center !important}.stk-f1419e3-column{--stk-column-gap:32px !important}@media screen and (max-width:767px){.stk-f1419e3-column{row-gap:24px !important}}<\/style><div class=\"stk-row stk-inner-blocks has-text-align-center stk--block-align-f1419e3 stk-block-content stk-content-align stk-f1419e3-column alignwide\">\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-7592ffe\" data-v=\"4\" data-block-id=\"7592ffe\"><style>.stk-7592ffe{align-self:flex-start !important}.stk-7592ffe-inner-blocks{justify-content:center !important}.stk-7592ffe-container{display:flex !important}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-7592ffe-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-7592ffe-inner-blocks\">\n<div class=\"wp-block-stackable-image stk-block-image stk-block stk-f7b3584\" data-block-id=\"f7b3584\"><style>.stk-f7b3584 .stk-img-wrapper{width:100% !important}<\/style><figure><span class=\"stk-img-wrapper stk-image--shape-stretch\"><img loading=\"lazy\" decoding=\"async\" class=\"stk-img wp-image-1001\" src=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/header.jpg\" width=\"980\" height=\"179\" srcset=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/header.jpg 980w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/header-300x55.jpg 300w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/header-768x140.jpg 768w\" sizes=\"auto, (max-width: 980px) 100vw, 980px\" \/><\/span><\/figure><\/div>\n\n\n\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-0ddd470\" id=\"4-programmable-aging-sensor-for-automotive-safety-critical-applications\" data-block-id=\"0ddd470\"><h5 class=\"stk-block-heading__text has-text-align-center\">4. Programmable Aging Sensor for Automotive Safety-Critical Applications<\/h5><\/div>\n\n\n\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-530e90d\" data-block-id=\"530e90d\"><style>.stk-530e90d{margin-bottom:48px !important}<\/style><p class=\"stk-block-text__text has-text-align-justify\"><strong><em>Abstract:<\/em><\/strong> Electronic systems for safety-critical automotive applications must operate for many years in harsh environments. Reliability issues are worsening with device scaling down, while performance and quality requirements are increasing. One of the key reliability issues is long-term performance degradation due to aging. For safe operation, aging monitoring should be performed on chip, namely using built-in aging sensors (activated from time to time). The purpose of this paper is to present a novel programmable nanometer aging sensor. The proposed aging sensor allows several levels of circuit failure prediction and exhibits low sensitivity to PVT (Process, power supply Voltage and Temperature) variations. Simulation results with a 65 nm sensor design are presented, that ascertain the usefulness of the proposed solution.<\/p><\/div>\n\n\n\n<div class=\"wp-block-stackable-button-group stk-block-button-group stk-block stk-2795493\" data-block-id=\"2795493\"><div class=\"stk-row stk-inner-blocks stk-block-content stk-button-group\">\n<div class=\"wp-block-stackable-button stk-block-button is-style-plain stk-block stk-7027fee\" data-block-id=\"7027fee\"><style>.stk-7027fee .stk-button{background:transparent !important}<\/style><a class=\"stk-link stk-button stk--hover-effect-darken\" href=\"https:\/\/ieeexplore.ieee.org\/document\/5457131\" target=\"_blank\" rel=\"noreferrer noopener\"><span class=\"stk-button__inner-text\">Go to Paper<\/span><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" data-prefix=\"fas\" data-icon=\"arrow-right\" class=\"svg-inline--fa fa-arrow-right fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 448 512\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M190.5 66.9l22.2-22.2c9.4-9.4 24.6-9.4 33.9 0L441 239c9.4 9.4 9.4 24.6 0 33.9L246.6 467.3c-9.4 9.4-24.6 9.4-33.9 0l-22.2-22.2c-9.5-9.5-9.3-25 .4-34.3L311.4 296H24c-13.3 0-24-10.7-24-24v-32c0-13.3 10.7-24 24-24h287.4L190.9 101.2c-9.8-9.3-10-24.8-.4-34.3z\"><\/path><\/svg><\/div><\/span><\/a><\/div>\n<\/div><\/div>\n<\/div><\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-af3ac63\" data-v=\"4\" data-block-id=\"af3ac63\"><style>.stk-af3ac63{align-self:flex-start !important}.stk-af3ac63-inner-blocks{justify-content:center !important}.stk-af3ac63-container{display:flex !important}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-af3ac63-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-af3ac63-inner-blocks\">\n<div class=\"wp-block-stackable-image stk-block-image stk-block stk-702e444\" data-block-id=\"702e444\"><style>.stk-702e444 .stk-img-wrapper{width:100% !important}<\/style><figure><span class=\"stk-img-wrapper stk-image--shape-stretch\"><img loading=\"lazy\" decoding=\"async\" class=\"stk-img wp-image-1006\" src=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/VLSI-Test2010.jpg\" width=\"778\" height=\"150\" srcset=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/VLSI-Test2010.jpg 778w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/VLSI-Test2010-300x58.jpg 300w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/VLSI-Test2010-768x148.jpg 768w\" sizes=\"auto, (max-width: 778px) 100vw, 778px\" \/><\/span><\/figure><\/div>\n\n\n\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-c5f9182\" id=\"5-low-sensitivity-to-process-variations-aging-sensor-for-automotive-safety-critical-applications\" data-block-id=\"c5f9182\"><h5 class=\"stk-block-heading__text has-text-align-center\">5. Low Sensitivity to Process Variations Aging Sensor for Automotive Safety Critical Applications<\/h5><\/div>\n\n\n\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-6029c4e\" data-block-id=\"6029c4e\"><style>.stk-6029c4e{margin-bottom:48px !important}<\/style><p class=\"stk-block-text__text has-text-align-justify\"><strong><em>Abstract:<\/em><\/strong> In this paper, circuit failure prediction by timing degradation is used to monitor semiconductor aging, which is a safety-critical problem in the automotive market. Reliability and variability issues are worsening with device scaling down. For safe operation, we propose on-chip, on-line aging monitoring. A novel aging sensor (to be selectively inserted in key locations in the design and to be activated from time to time) is proposed. The aging sensor is a programmable delay sensor, allowing decision-making for several degrees of severity in the aging process. It detects abnormal delays, regardless of their origin. Hence, it can uncover normal aging (namely, due to NBTI) and delay faults due to physical defects activated by long circuit operation. The proposed aging sensor has been optimized to exhibit low sensitivity to PVT (Process, power supply Voltage and Temperature) variations. Simulation results with a 65 nm sensor design are presented, ascertaining its usefulness and its low sensitivity, in particular to process variations.<\/p><\/div>\n\n\n\n<div class=\"wp-block-stackable-button-group stk-block-button-group stk-block stk-0a3ae54\" data-block-id=\"0a3ae54\"><div class=\"stk-row stk-inner-blocks stk-block-content stk-button-group\">\n<div class=\"wp-block-stackable-button stk-block-button is-style-plain stk-block stk-c2f5156\" data-block-id=\"c2f5156\"><style>.stk-c2f5156 .stk-button{background:transparent !important}<\/style><a class=\"stk-link stk-button stk--hover-effect-darken\" href=\"https:\/\/ieeexplore.ieee.org\/document\/5469568\" target=\"_blank\" rel=\"noreferrer noopener\"><span class=\"stk-button__inner-text\">Go to Paper<\/span><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" data-prefix=\"fas\" data-icon=\"arrow-right\" class=\"svg-inline--fa fa-arrow-right fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 448 512\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M190.5 66.9l22.2-22.2c9.4-9.4 24.6-9.4 33.9 0L441 239c9.4 9.4 9.4 24.6 0 33.9L246.6 467.3c-9.4 9.4-24.6 9.4-33.9 0l-22.2-22.2c-9.5-9.5-9.3-25 .4-34.3L311.4 296H24c-13.3 0-24-10.7-24-24v-32c0-13.3 10.7-24 24-24h287.4L190.9 101.2c-9.8-9.3-10-24.8-.4-34.3z\"><\/path><\/svg><\/div><\/span><\/a><\/div>\n<\/div><\/div>\n<\/div><\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-36b2b8c\" data-v=\"4\" data-block-id=\"36b2b8c\"><style>.stk-36b2b8c{align-self:flex-start !important}.stk-36b2b8c-inner-blocks{justify-content:center !important}.stk-36b2b8c-container{display:flex !important}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-36b2b8c-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-36b2b8c-inner-blocks\">\n<div class=\"wp-block-stackable-image stk-block-image stk-block stk-99dde41\" data-block-id=\"99dde41\"><figure><span class=\"stk-img-wrapper stk-image--shape-stretch\"><img loading=\"lazy\" decoding=\"async\" class=\"stk-img wp-image-1008\" src=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/VLSI-Test2009.jpg\" width=\"778\" height=\"150\" srcset=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/VLSI-Test2009.jpg 778w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/VLSI-Test2009-300x58.jpg 300w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/VLSI-Test2009-768x148.jpg 768w\" sizes=\"auto, (max-width: 778px) 100vw, 778px\" \/><\/span><\/figure><\/div>\n\n\n\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-e5d53d3\" id=\"6-stuck-open-fault-leakage-and-testing-in-nanometer-technologies\" data-block-id=\"e5d53d3\"><h5 class=\"stk-block-heading__text has-text-align-center\">6. Stuck-Open Fault Leakage and Testing in Nanometer Technologies<\/h5><\/div>\n\n\n\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-ef48680\" data-block-id=\"ef48680\"><style>.stk-ef48680{margin-bottom:48px !important}<\/style><p class=\"stk-block-text__text has-text-align-justify\"><strong><em>Abstract:<\/em><\/strong> The stuck-open fault (SOF) is a difficult, hard failure mechanism unique to CMOS technology. Its detection requires a specific 2-vector pair that examines each transistor in the logic gate for an open defect in its drain and\/or source. In this work it is shown that this failure mechanism is very alive and relevant to modern technologies. The small nanometer technology capacitances and the increased leakage currents result in faster discharges of the floating high impedance node making fault detection more difficult. A test vector strategy is proposed to improve the detection of this fault for technologies with gate current leakage.<\/p><\/div>\n\n\n\n<div class=\"wp-block-stackable-button-group stk-block-button-group stk-block stk-a67d6f9\" data-block-id=\"a67d6f9\"><div class=\"stk-row stk-inner-blocks stk-block-content stk-button-group\">\n<div class=\"wp-block-stackable-button stk-block-button is-style-plain stk-block stk-0c850b7\" data-block-id=\"0c850b7\"><style>.stk-0c850b7 .stk-button{background:transparent !important}<\/style><a class=\"stk-link stk-button stk--hover-effect-darken\" href=\"https:\/\/ieeexplore.ieee.org\/document\/5116653\" target=\"_blank\" rel=\"noreferrer noopener\"><span class=\"stk-button__inner-text\">Go to Paper<\/span><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg aria-hidden=\"true\" data-prefix=\"fas\" data-icon=\"arrow-right\" class=\"svg-inline--fa fa-arrow-right fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 448 512\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M190.5 66.9l22.2-22.2c9.4-9.4 24.6-9.4 33.9 0L441 239c9.4 9.4 9.4 24.6 0 33.9L246.6 467.3c-9.4 9.4-24.6 9.4-33.9 0l-22.2-22.2c-9.5-9.5-9.3-25 .4-34.3L311.4 296H24c-13.3 0-24-10.7-24-24v-32c0-13.3 10.7-24 24-24h287.4L190.9 101.2c-9.8-9.3-10-24.8-.4-34.3z\"><\/path><\/svg><\/div><\/span><\/a><\/div>\n<\/div><\/div>\n<\/div><\/div><\/div>\n<\/div><\/div>\n<\/div><\/div><\/div>\n<\/div><\/div>\n<\/div><\/div><\/div>\n<\/details>\n\n\n\n<details class=\"wp-block-stackable-accordion stk-block-accordion stk-inner-blocks stk-block-content stk-block stk-0c9c732 is-style-default\" data-block-id=\"0c9c732\">\n<summary class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-4076848 stk--container-small stk-block-accordion__heading\" data-v=\"4\" data-block-id=\"4076848\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-4076848-container stk-hover-parent\"><div class=\"stk-block-content stk-inner-blocks stk-4076848-inner-blocks\">\n<div class=\"wp-block-stackable-icon-label stk-block-icon-label stk-block stk-794d24b\" data-block-id=\"794d24b\"><div class=\"stk-row stk-inner-blocks stk-block-content\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-2a46f00\" id=\"ponencias-y-presentaciones\" data-block-id=\"2a46f00\"><h2 class=\"stk-block-heading__text\">Oral Presentations<\/h2><\/div>\n\n\n\n<div class=\"wp-block-stackable-icon stk-block-icon stk-block stk-dd6a233\" data-block-id=\"dd6a233\"><span class=\"stk--svg-wrapper\"><div class=\"stk--inner-svg\"><svg style=\"height:0;width:0\"><defs><lineargradient id=\"linear-gradient-dd6a233\" x1=\"0\" x2=\"100%\" y1=\"0\" y2=\"0\"><stop offset=\"0%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-dd-6-a-233-color-1)\"><\/stop><stop offset=\"100%\" style=\"stop-opacity:1;stop-color:var(--linear-gradient-dd-6-a-233-color-2)\"><\/stop><\/lineargradient><\/defs><\/svg><svg data-prefix=\"fas\" data-icon=\"chevron-down\" class=\"svg-inline--fa fa-chevron-down fa-w-14\" xmlns=\"http:\/\/www.w3.org\/2000\/svg\" viewbox=\"0 0 448 512\" aria-hidden=\"true\" width=\"32\" height=\"32\"><path fill=\"currentColor\" d=\"M207.029 381.476L12.686 187.132c-9.373-9.373-9.373-24.569 0-33.941l22.667-22.667c9.357-9.357 24.522-9.375 33.901-.04L224 284.505l154.745-154.021c9.379-9.335 24.544-9.317 33.901.04l22.667 22.667c9.373 9.373 9.373 24.569 0 33.941L240.971 381.476c-9.373 9.372-24.569 9.372-33.942 0z\"><\/path><\/svg><\/div><\/span><\/div>\n<\/div><\/div>\n<\/div><\/div><\/summary>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-15308e4 stk-block-accordion__content\" data-v=\"4\" data-block-id=\"15308e4\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-15308e4-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-15308e4-inner-blocks\">\n<div class=\"wp-block-stackable-columns alignwide stk-block-columns stk-block stk-2800815\" data-block-id=\"2800815\"><div class=\"stk-row stk-inner-blocks stk-block-content stk-content-align stk-2800815-column\">\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-df047bf\" data-v=\"4\" data-block-id=\"df047bf\"><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-df047bf-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-df047bf-inner-blocks\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-454a125\" id=\"ponencias-en-conferencias-internacionales\" data-block-id=\"454a125\"><style>.stk-454a125{margin-bottom:16px !important}<\/style><h4 class=\"stk-block-heading__text has-text-align-center\">Oral Presentations in International Conferences<\/h4><\/div>\n\n\n\n<div class=\"wp-block-stackable-feature-grid alignwide stk-block-feature-grid stk-block-columns stk-block stk-5d2931f is-style-large-mid\" data-block-id=\"5d2931f\"><style>.stk-5d2931f .stk--block-align-5d2931f{align-items:center !important}.stk-5d2931f-column{--stk-column-gap:32px !important}@media screen and (max-width:767px){.stk-5d2931f-column{row-gap:24px !important}}<\/style><div class=\"stk-row stk-inner-blocks has-text-align-center stk--block-align-5d2931f stk-block-content stk-content-align stk-5d2931f-column alignwide\">\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-698f3da\" data-v=\"4\" data-block-id=\"698f3da\"><style>.stk-698f3da{align-self:flex-start !important}.stk-698f3da-inner-blocks{justify-content:center !important}.stk-698f3da-container{display:flex !important}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-698f3da-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-698f3da-inner-blocks\">\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-b623bd3\" id=\"1-aging-robust-monitoring-and-techniques-to-improve-performance-on-digital-systems\" data-block-id=\"b623bd3\"><style>.stk-b623bd3{margin-bottom:0px !important}<\/style><h5 class=\"stk-block-heading__text has-text-align-center\">1. Aging Robust Monitoring and techniques to improve Performance on Digital Systems<\/h5><\/div>\n\n\n\n<div class=\"wp-block-stackable-image stk-block-image stk-block stk-6359ac1\" data-block-id=\"6359ac1\"><style>.stk-6359ac1{margin-bottom:18px !important}.stk-6359ac1 .stk-img-wrapper{width:100% !important}<\/style><figure><span class=\"stk-img-wrapper stk-image--shape-stretch\"><img loading=\"lazy\" decoding=\"async\" class=\"stk-img wp-image-1230\" src=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/LATWnew.jpg\" width=\"1534\" height=\"216\" srcset=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/LATWnew.jpg 1534w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/LATWnew-300x42.jpg 300w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/LATWnew-1024x144.jpg 1024w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/LATWnew-768x108.jpg 768w\" sizes=\"auto, (max-width: 1534px) 100vw, 1534px\" \/><\/span><\/figure><\/div>\n\n\n\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-0696278\" data-block-id=\"0696278\"><style>.stk-0696278{margin-bottom:48px !important}<\/style><p class=\"stk-block-text__text has-text-align-justify\"><strong><em>Abstract:<\/em><\/strong> As process technology continues to shrink, Process Variations and Aging effects have an increasing impact on the reliability and performance of manufactured circuits. Aging effects produce performance degradation as time progresses. This degradation rate depends on: a) Operational conditions and b) Static technological parameters defined in the fabrication process. Moreover, performance of electronic systems for safety-critical applications which operate for many years in harsh environments are more prompt to be impacted by aging. In order to guarantee a safe operation in advanced technologies, aging monitoring should be performed on chip using built-in aging sensors. The purpose of this work is to present a methodology to determine the correct location for aging sensor insertion, considering the combined impact of process variations (PV) and aging effects.  In order to implement the methodology a path-based Statistical Timing Analysis framework and tools have been developed. It is shown that delay path reordering, asssociated with PV and Aging, may justify the insertion of a few aditional sensors to cover abnormal delays of signal paths that become critical under long system operation.\n\nIn this Workshoop Julio Cesar Vazquez has presented his main important PhD disertation results. After evaluating all the PhD disertations, submited in this workshoop, an expert evaluators commitee decided to award this disertation as the best doctoral thesis.<br><br>En este taller, Julio C\u00e9sar V\u00e1zquez present\u00f3 los resultados m\u00e1s importantes de su tesis doctoral. Despu\u00e9s de evaluar todas las tesis doctorales presentadas en este taller, un comit\u00e9 de evaluadores expertos decidi\u00f3 otorgar a esta disertaci\u00f3n el premio a la mejor tesis doctoral.<\/p><\/div>\n<\/div><\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-09918f0\" data-v=\"4\" data-block-id=\"09918f0\"><style>.stk-09918f0{align-self:flex-start !important}.stk-09918f0-inner-blocks{justify-content:center !important}.stk-09918f0-container{display:flex !important}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-09918f0-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-09918f0-inner-blocks\">\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-e3b7a13\" data-block-id=\"e3b7a13\"><style>.stk-e3b7a13{margin-bottom:0px !important}<\/style><p class=\"stk-block-text__text has-text-align-justify\"> The certificate of this award is shown below: <\/p><\/div>\n\n\n\n<div class=\"wp-block-stackable-image stk-block-image stk-block stk-3eeff51\" data-block-id=\"3eeff51\"><style>.stk-3eeff51{margin-bottom:10px !important}.stk-3eeff51 .stk-img-wrapper{width:100% !important}<\/style><figure><span class=\"stk-img-wrapper stk-image--shape-stretch\"><img loading=\"lazy\" decoding=\"async\" class=\"stk-img wp-image-1233\" src=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Reconocimiento-mejor-tesis.png\" width=\"1022\" height=\"717\" srcset=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Reconocimiento-mejor-tesis.png 1022w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Reconocimiento-mejor-tesis-300x210.png 300w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Reconocimiento-mejor-tesis-768x539.png 768w\" sizes=\"auto, (max-width: 1022px) 100vw, 1022px\" \/><\/span><\/figure><\/div>\n\n\n\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-c7a24ea\" id=\"2-low-sensitivity-to-process-variations-aging-sensor-for-automotive-safety-critical-applications\" data-block-id=\"c7a24ea\"><style>.stk-c7a24ea{margin-bottom:0px !important}<\/style><h5 class=\"stk-block-heading__text has-text-align-center\">2. Low Sensitivity to Process Variations Aging Sensor for Automotive Safety Critical Applications<\/h5><\/div>\n\n\n\n<div class=\"wp-block-stackable-image stk-block-image stk-block stk-b9ebb39\" data-block-id=\"b9ebb39\"><style>.stk-b9ebb39 .stk-img-wrapper{width:100% !important}<\/style><figure><span class=\"stk-img-wrapper stk-image--shape-stretch\"><img loading=\"lazy\" decoding=\"async\" class=\"stk-img wp-image-1006\" src=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/VLSI-Test2010.jpg\" width=\"778\" height=\"150\" srcset=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/VLSI-Test2010.jpg 778w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/VLSI-Test2010-300x58.jpg 300w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/VLSI-Test2010-768x148.jpg 768w\" sizes=\"auto, (max-width: 778px) 100vw, 778px\" \/><\/span><\/figure><\/div>\n\n\n\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-edec41b\" data-block-id=\"edec41b\"><style>.stk-edec41b{margin-bottom:48px !important}<\/style><p class=\"stk-block-text__text has-text-align-justify\">This paper was submited in the \u00abVLSI Test Symposium\u00bb and also was selected as oral presentation. Therefore this paper is also included here. The abstract of this paper can be shown in 5th article position of the above section.<\/p><\/div>\n<\/div><\/div><\/div>\n<\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-3d2ae52\" id=\"presentaciones-en-universidades\" data-block-id=\"3d2ae52\"><style>.stk-3d2ae52{margin-bottom:16px !important}<\/style><h4 class=\"stk-block-heading__text has-text-align-center\">Oral Presentations in Universities<\/h4><\/div>\n\n\n\n<div class=\"wp-block-stackable-feature-grid alignwide stk-block-feature-grid stk-block-columns stk-block stk-1a62154 is-style-large-mid\" data-block-id=\"1a62154\"><style>.stk-1a62154 .stk--block-align-1a62154{align-items:center !important}.stk-1a62154-column{--stk-column-gap:32px !important}@media screen and (max-width:767px){.stk-1a62154-column{row-gap:24px !important}}<\/style><div class=\"stk-row stk-inner-blocks has-text-align-center stk--block-align-1a62154 stk-block-content stk-content-align stk-1a62154-column alignwide\">\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-0a1ec93\" data-v=\"4\" data-block-id=\"0a1ec93\"><style>.stk-0a1ec93{align-self:flex-start !important}.stk-0a1ec93-inner-blocks{justify-content:center !important}.stk-0a1ec93-container{display:flex !important}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-0a1ec93-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-0a1ec93-inner-blocks\">\n<div class=\"wp-block-stackable-image stk-block-image stk-block stk-7924aea\" data-block-id=\"7924aea\"><style>.stk-7924aea .stk-img-wrapper{width:100% !important}<\/style><figure><span class=\"stk-img-wrapper stk-image--shape-stretch\"><img loading=\"lazy\" decoding=\"async\" class=\"stk-img wp-image-1161\" src=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Tec.jpg\" width=\"1600\" height=\"1575\" srcset=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Tec.jpg 1600w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Tec-300x295.jpg 300w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Tec-1024x1008.jpg 1024w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Tec-768x756.jpg 768w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/Tec-1536x1512.jpg 1536w\" sizes=\"auto, (max-width: 1600px) 100vw, 1600px\" \/><\/span><\/figure><\/div>\n\n\n\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-e27f51a\" id=\"consideraciones-en-el-diseno-de-hardware-firmware-para-io-t-en-aplicaciones-de-logistica-y-transporte\" data-block-id=\"e27f51a\"><h5 class=\"stk-block-heading__text has-text-align-center\">Hardware-Firmware Design Considerations for IoT in Logistics and Transportation Applications<\/h5><\/div>\n\n\n\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-9ee072c\" data-block-id=\"9ee072c\"><style>.stk-9ee072c{margin-bottom:48px !important}<\/style><p class=\"stk-block-text__text has-text-align-justify\"><strong><em>Abstract:<\/em><\/strong> This lecture was given at the Tecnol\u00f3gico de Monterrey, Puebla campus. It covered the most important aspects that must be taken into account when designing Internet of Things (IoT) systems applied to the Logistics and Transportation industry. <\/p><\/div>\n<\/div><\/div><\/div>\n\n\n\n<div class=\"wp-block-stackable-column stk-block-column stk-column stk-block stk-4b5160c\" data-v=\"4\" data-block-id=\"4b5160c\"><style>.stk-4b5160c{align-self:flex-start !important}.stk-4b5160c-inner-blocks{justify-content:center !important}.stk-4b5160c-container{display:flex !important}<\/style><div class=\"stk-column-wrapper stk-block-column__content stk-container stk-4b5160c-container stk--no-background stk--no-padding\"><div class=\"stk-block-content stk-inner-blocks stk-4b5160c-inner-blocks\">\n<div class=\"wp-block-stackable-image stk-block-image stk-block stk-9872efc\" data-block-id=\"9872efc\"><style>.stk-9872efc .stk-img-wrapper{width:100% !important}<\/style><figure><span class=\"stk-img-wrapper stk-image--shape-stretch\"><img loading=\"lazy\" decoding=\"async\" class=\"stk-img wp-image-1160\" src=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/UTEQ.jpg\" width=\"1600\" height=\"1221\" srcset=\"https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/UTEQ.jpg 1600w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/UTEQ-300x229.jpg 300w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/UTEQ-1024x781.jpg 1024w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/UTEQ-768x586.jpg 768w, https:\/\/drjuliovazqueztechdesign.com\/wp-content\/uploads\/2024\/07\/UTEQ-1536x1172.jpg 1536w\" sizes=\"auto, (max-width: 1600px) 100vw, 1600px\" \/><\/span><\/figure><\/div>\n\n\n\n<div class=\"wp-block-stackable-heading stk-block-heading stk-block-heading--v2 stk-block stk-442b234\" id=\"topicos-avanzados-en-el-diseno-electronico-y-tecnologia-de-semiconductores\" data-block-id=\"442b234\"><h5 class=\"stk-block-heading__text has-text-align-center\">Advanced Topics in Electronic Design and Semiconductor Technology.<\/h5><\/div>\n\n\n\n<div class=\"wp-block-stackable-text stk-block-text stk-block stk-9373ebb\" data-block-id=\"9373ebb\"><style>.stk-9373ebb{margin-bottom:48px !important}<\/style><p class=\"stk-block-text__text has-text-align-justify\"><strong><em>Abstract:<\/em><\/strong> This seminar was given at the Technological University of Quer\u00e9taro. It discussed the considerations to be taken into account when developing microcontroller-based electronic systems. Best practices were presented in: a) hardware design, specifically when designing voltage regulators, and b) firmware design for microcontroller-governed systems. <\/p><\/div>\n<\/div><\/div><\/div>\n<\/div><\/div>\n<\/div><\/div><\/div>\n<\/div><\/div>\n<\/div><\/div><\/div>\n<\/details>","protected":false},"excerpt":{"rendered":"<p>Dr. Julio C\u00e9sar V\u00e1zquez Julio C\u00e9sar V\u00e1zquez es un ingeniero altamente capacitado y experimentado, con un fuerte enfoque en la innovaci\u00f3n tecnol\u00f3gica y la resoluci\u00f3n de problemas. Su experiencia radica en el dise\u00f1o de hardware de sistemas electr\u00f3nicos, con un \u00e9nfasis particular en el dise\u00f1o y test de Circuitos Integrados (IC) Digitales.El Dr. V\u00e1zquez obtuvo [&hellip;]<\/p>","protected":false},"author":1,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"om_disable_all_campaigns":false,"_uag_custom_page_level_css":"","_monsterinsights_skip_tracking":false,"_monsterinsights_sitenote_active":false,"_monsterinsights_sitenote_note":"","_monsterinsights_sitenote_category":0,"_uf_show_specific_survey":0,"_uf_disable_surveys":false,"footnotes":""},"class_list":["post-825","page","type-page","status-publish","hentry"],"blocksy_meta":{"has_hero_section":"disabled","styles_descriptor":{"styles":{"desktop":"","tablet":"","mobile":""},"google_fonts":[],"version":6},"vertical_spacing_source":"custom","content_area_spacing":"none"},"aioseo_notices":[],"uagb_featured_image_src":{"full":false,"thumbnail":false,"medium":false,"medium_large":false,"large":false,"1536x1536":false,"2048x2048":false,"trp-custom-language-flag":false},"uagb_author_info":{"display_name":"drjuliovazqueztechdesign.com","author_link":"https:\/\/drjuliovazqueztechdesign.com\/en\/author\/drjuliovazqueztechdesign-com\/"},"uagb_comment_info":0,"uagb_excerpt":"Dr. Julio C\u00e9sar V\u00e1zquez Julio C\u00e9sar V\u00e1zquez es un ingeniero altamente capacitado y experimentado, con un fuerte enfoque en la innovaci\u00f3n tecnol\u00f3gica y la resoluci\u00f3n de problemas. Su experiencia radica en el dise\u00f1o de hardware de sistemas electr\u00f3nicos, con un \u00e9nfasis particular en el dise\u00f1o y test de Circuitos Integrados (IC) Digitales.El Dr. V\u00e1zquez obtuvo&hellip;","_links":{"self":[{"href":"https:\/\/drjuliovazqueztechdesign.com\/en\/wp-json\/wp\/v2\/pages\/825","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/drjuliovazqueztechdesign.com\/en\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/drjuliovazqueztechdesign.com\/en\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/drjuliovazqueztechdesign.com\/en\/wp-json\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/drjuliovazqueztechdesign.com\/en\/wp-json\/wp\/v2\/comments?post=825"}],"version-history":[{"count":142,"href":"https:\/\/drjuliovazqueztechdesign.com\/en\/wp-json\/wp\/v2\/pages\/825\/revisions"}],"predecessor-version":[{"id":1541,"href":"https:\/\/drjuliovazqueztechdesign.com\/en\/wp-json\/wp\/v2\/pages\/825\/revisions\/1541"}],"wp:attachment":[{"href":"https:\/\/drjuliovazqueztechdesign.com\/en\/wp-json\/wp\/v2\/media?parent=825"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}